Lockstep comparators and related methods

ABSTRACT

Lockstep comparators and related methods are described. An example apparatus includes self-test logic circuitry having first outputs, and comparator logic including selection logic having first inputs and second outputs, ones of the first inputs coupled to the first outputs, first detection logic having second inputs and third outputs, the second inputs coupled to the second outputs, second detection logic having third inputs and fourth outputs, the third inputs coupled to the third outputs, latch logic having fifth inputs and fifth outputs, the third output and the fourth output coupled to the fifth inputs, and error detection logic having sixth inputs coupled to the fifth inputs.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. Pat. Application No.17/138,529 filed on Dec. 30, 2020 which is incorporated herein by thisreference.

FIELD OF THE DISCLOSURE

This disclosure relates generally to circuits and, more particularly, tolockstep comparators and related methods.

BACKGROUND

Safety protocols are used to ensure safety in electrical and/orelectronic systems. For example, International Organization forStandardization (ISO) 26262 is an international standard for functionalsafety of electrical and/or electronic systems in automobiles. Suchsafety protocols analyze risk (e.g., the combination of the frequency ofoccurrence of harm and the severity of that harm) associated withelectronic failures. Failures corresponding to electronics may be randomor systematic. Random failures typically correspond to hardware relatedpermanent or transient failures due to a system component loss offunctionality. Systematic failures typically correspond to designfaults, incorrect specifications, and/or not fit for purpose errors insoftware. Such safety protocols may analyze the electrical risksassociated with a hardware processor that may process a signal toimprove vehicle safety.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an illustration of an example system-on-a-chip (SoC) includingexample lockstep comparator circuitry to improve reliability and safetyassociated with an example hardware processor of the SoC.

FIG. 2 is a block diagram of an example implementation of the examplehardware processor of FIG. 1 , which includes the example lockstepcomparator circuitry of FIG. 1 .

FIG. 3 is a schematic illustration of an example implementation of theexample lockstep comparator circuitry of FIGS. 1 and/or 2 .

FIGS. 4A-4B are schematic illustrations of another exampleimplementation of the example lockstep comparator circuitry of FIGS. 1and/or 2 .

FIG. 5 is a timing diagram depicting example operation of the examplelockstep comparator circuitry of FIGS. 1, 2, 3, and/or 4A-4B.

FIG. 6 is a flowchart representative of an example process that may beperformed using machine readable instructions that may be executedand/or hardware configured to implement the example lockstep comparatorcircuitry of FIGS. 1, 2, 3, and/or 4A-4B to detect errors associatedwith one or more comparators.

FIG. 7 is another flowchart representative of an example process thatmay be performed using machine readable instructions that may beexecuted and/or hardware configured to implement the example lockstepcomparator circuitry of FIGS. 1, 2, 3, and/or 4A-4B to detect errorsassociated with one or more comparators.

FIG. 8 is a block diagram of an example processing platform structuredto execute the example process of FIGS. 6 and/or 7 to implement theexample lockstep comparator circuitry of FIGS. 1, 2, 3, and/or 4A-4B.

DETAILED DESCRIPTION

The figuresare not to scale. In general, the same reference numbers willbe used throughout the drawing(s) and accompanying written descriptionto refer to the same or like parts. As used herein, connectionreferences (e.g., attached, coupled, connected, and joined) may includeintermediate members between the elements referenced by the connectionreference and/or relative movement between those elements unlessotherwise indicated. As such, connection references do not necessarilyinfer that two elements are directly connected and/or in fixed relationto each other.

Unless specifically stated otherwise, descriptors such as “first,”“second,” “third,” etc., are used herein without imputing or otherwiseindicating any meaning of priority, physical order, arrangement in alist, and/or ordering in any way, but are merely used as labels and/orarbitrary names to distinguish elements for ease of understanding thedisclosed examples. In some examples, the descriptor “first” may be usedto refer to an element in the detailed description, while the sameelement may be referred to in a claim with a different descriptor suchas “second” or “third”. In such instances, it should be understood thatsuch descriptors are used merely for identifying those elementsdistinctly that might, for example, otherwise share a same name. As usedherein “substantially real time” refers to occurrence in a nearinstantaneous manner recognizing there may be real world delays forcomputing time, transmission, etc. Thus, unless otherwise specified,“substantially parallel” and “substantially real time” refer to realtime +/-1 second.

The complexity of computing and/or electrical devices has increasedsignificantly with advances in technology. Such devices includehardware, software, and/or firmware to perform particular function(s).If an error occurs in the hardware, software, and/or firmware, suchdevices may not perform the particular function(s) or may execute theparticular function(s) with poor performance. Such inability to performand/or poor execution performance may affect the results of a relatedsystem and/or, more generally, the reliability and/or safety associatedwith operation of the related system. To detect and/or correct theseerrors, a device may include functional safety hardware. For example, anautopilot computing device, which may facilitate execution of autonomousoperations of a vehicle (e.g., an air-based vehicle, a land-basedvehicle, etc.), may include hardware that fulfills and/or otherwisesatisfies requirements for functional safety. Functional safetyrequirements may be based on International Standards Organization (ISO)26262, International Electrotechnical Commission (IEC) 61508, etc. ISO26262 is an international standard for functional safety of electricaland/or electronic systems in production automobiles. IEC 61508 is aninternational standard corresponding to applying, designing, deploying,and maintaining automatic protection of safety-related systems.

Some applications utilize system-on-a-chip (SoC) hardware to carry outcomputing tasks. Some such SoC hardware include lockstep hardware, suchas a lockstep processor or central processing unit (CPU), to facilitatecompliance with functional safety requirements. For example, a “lockstepCPU,” “lockstep processor,” “lockstep hardware,” or the like may referto a multi-core compute hardware resource in which two or more cores ofthe multi-core compute hardware resource perform similar operations inparallel and each feed their respective outputs into a respective blockof comparator logic to determine whether the outputs are equal. Forexample, the blocks of comparator logic may detect a fault conditionassociated with the multi-core compute hardware resource in response todetermining that one(s) of the outputs from the two or more cores arenot equal.

In some instances, functional safety standards mandate a requirement toexecute a diagnostic of and/or otherwise test the lockstep capability,functionality, etc., of the lockstep hardware. However, prior locksteptesting implementations are intrusive to the application because theymay make the lockstep hardware unavailable to execute code with the sameintegrity during the test of the lockstep functionality as compared tonormal operation outside of the test. Alternatively, to facilitateonline test sequencing, some prior lockstep testing implementationsutilize dual comparators. However, these dual comparators may not beoperated in lockstep (e.g., configured to be operated in lockstep) witheach other and do not provide lockstep test functionality as disclosedherein.

Some prior lockstep testing implementations are significantly slow tocomplete. For example, in some prior lockstep testing implementations,it may require 2*N cycles for lockstep hardware to compare N signals. Insome such examples, a single lockstep comparator may be utilized, whichmay result in the significantly long self-test sequences. Some priorlockstep testing implementations may also not have the ability toisolate fault conditions of lockstep hardware such as failuresassociated with lockstep comparators. Such isolation of fault conditionsmay provide benefits such as increased granularity of debugginginformation, which may be used to improve operation of current or futurelockstep hardware.

Examples described herein include lockstep comparators and relatedmethods. In some described examples, the lockstep comparators outputdiagnostic data during online operation of lockstep hardware, which mayfacilitate improved offline failure analysis associated with detectedfault conditions of the lockstep hardware. In some described examples,the lockstep comparators include two or more lockstep comparators thatmay implement online test sequencing. For example, the lockstepcomparators may test lockstep functionality while the lockstep hardwareis online and/or otherwise executing application code. Advantageously,the lockstep comparators as described herein may test the lockstepfunctionality of the lockstep hardware without taking the lockstephardware offline by replacing relatively long test sequences in priorimplementations with redundancy logic. For example, lockstep comparatorsas described herein may complete a diagnostic test of the lockstephardware in 8 clock cycles compared to thousands of clock cycles in someprior lockstep testing implementations. Advantageously, the examplelockstep comparators as described herein may provide comprehensive debuginformation (e.g., fault condition data, port information (e.g.,port-mismatch values), etc.) to external hardware, software, and/orfirmware, such as a computing device, a user interface associated withthe computing device, etc.

FIG. 1 is an illustration of an example computing environment 100including an example computing system 102 including example lockstepcomparator logic (LCL) 104 to identify diagnostics of and/or otherwiseeffectuating testing of lockstep capabilities, functionality, etc., oflockstep hardware. For example, the LCL 104 may compare outputs from oneor more cores, modules, etc., of lockstep hardware and identify a faultcondition based on the comparison of the outputs.

The computing system 102 includes an example central processing unit(CPU) 106, a first example acceleration resource (ACCELERATION RESOURCEA) 108, a second example acceleration resource (ACCELERATION RESOURCE B)110, an example general purpose processing resource 112, an exampleinterface resource 114, an example bus 116, an example power source 118,and an example datastore 120. In this example, the datastore 120 storesand/or otherwise includes example lockstep debug data 122. Furtherdepicted in the illustrated example of FIG. 1 is an example userinterface 124, an example network 126, and an example central facility128, which may store the lockstep debug data 122.

In some examples, the computing system 102 is a system-on-a-chip (SoC)representative of one or more integrated circuits (ICs) (e.g., compactICs) that incorporate components of a computer or other electronicsystem in a compact format. For example, the computing system 102 may beimplemented with a combination of one or more programmable processors,hardware logic, and/or hardware peripherals and/or interfaces.Additionally or alternatively, the example computing system 102 of FIG.1 may include memory, input/output (I/O) port(s), and/or secondarystorage. For example, the computing system 102 includes the LCL 104, theCPU 106, the first acceleration resource 108, the second accelerationresource 110, the general purpose processing resource 112, the interfaceresource 114, the bus 116, the power source 118, the datastore 120, thememory, the I/O port(s), and/or the secondary storage all on the samesubstrate. In some examples, the computing system 102 includes digital,analog, mixed-signal, radio frequency (RF), or other signal processingfunctions.

In some examples, the computing system 102 implements an electroniccontrol unit (ECU) in a vehicle (e.g., a driver operated vehicle, anautonomous vehicle, etc.). For example, the computing system 102 may bean ECU that controls one or more components, functions, etc., of avehicle. In some examples, the computing system 102 may be an ECU thatcontrols an engine (e.g., a combustion engine), a motor (e.g., anelectric motor), a transmission, an infotainment system, a lightdetection and ranging (LIDAR) system, etc., and/or a combinationthereof.

The CPU 106 is a multi-core CPU. For example, the CPU 106 includes aplurality of cores (e.g., compute cores, processor cores, etc.) that mayexecute instructions, application code, etc. The first accelerationresource 108 is a graphics processing unit (GPU). For example, the firstacceleration resource 108 may be a GPU that generates computer graphics,executes general-purpose computing, etc. In some examples, the firstacceleration resource 108 may generates graphics for the user interface124. The second acceleration resource 110 is an AI accelerator. Forexample, the second acceleration resource 110 may be a vision processingunit to effectuate machine or computer vision computing tasks,object-identification computing tasks, etc. The general purposeprocessing resource 112 is a programmable processor. For example, thegeneral purpose processing resource 112 may be a CPU, a GPU, etc.Alternatively, one or more of the first acceleration resource 108, thesecond acceleration resource 110, and/or the general purpose processingresource 112 may be a different type of hardware such as a digitalsignal processor (DSP), an application specific integrated circuit(ASIC), a programmable logic device (PLD), and/or a field programmablelogic device (FPLD) (e.g., a field-programmable gate array (FPGA)).

The interface resource 114 is hardware that implements and/or isrepresentative of one or more interfaces (e.g., computing interfaces,network interfaces, vehicle network or bus interfaces, industrialprotocol network or bus interfaces, etc.). For example, the interfaceresource 114 may be hardware, software, and/or firmware that implementsa communication device (e.g., a communication gateway, a networkinterface card (NIC), a smart NIC, etc.) such as a transmitter, areceiver, a transceiver, a modem, an industrial protocol gateway, aresidential gateway, a wireless access point, and/or a network interfaceto facilitate exchange of data with external machines (e.g., computingdevices of any kind) via the network 126. In some examples, thecommunication is effectuated via a Bluetooth® connection, a controllerarea network (CAN) bus, an Ethernet connection, a digital subscriberline (DSL) connection, a wireless fidelity (Wi-Fi) connection, atelephone line connection, a coaxial cable system, a satellite system, aline-of-site wireless system, a cellular telephone system, etc. Forexample, the interface resource 114 may be implemented by any type ofinterface standard, such as a Bluetooth® interface, a CAN interface, anEthernet interface, a Wi-Fi interface, a universal serial bus (USB), anear field communication (NFC) interface, and/or a PCI expressinterface.

The computing system 102 includes the power source 118 to deliver powerto resource(s) of the computing system 102. In this example, the powersource 118 is implemented by one or more batteries (e.g., lithium-ionbatteries or any other chargeable battery or power source). For example,the power source 118 may be chargeable using a power adapter orconverter (e.g., an AC/DC power converter), a wall outlet (e.g., a 110 VAC wall outlet, a 220 V AC wall outlet, etc.), etc. In some examples,the power source 118 may be chargeable by a vehicle component such as analternator.

The computing system 102 includes the datastore 120 to record data(e.g., the lockstep debug data 122, etc.). The datastore 120 may beimplemented by a volatile memory (e.g., one or more flip-flops,Synchronous Dynamic Random Access Memory (SDRAM), Dynamic Random AccessMemory (DRAM), RAMBUS Dynamic Random Access Memory (RDRAM), etc.) and/ora non-volatile memory (e.g., flash memory). The datastore 120 mayadditionally or alternatively be implemented by one or more double datarate (DDR) memories, such as DDR, DDR2, DDR3, DDR4, mobile DDR (mDDR),etc. The datastore 120 may additionally or alternatively be implementedby one or more mass storage devices such as hard disk drive(s) (HDD(s)),compact disk (CD) drive(s), digital versatile disk (DVD) drive(s),solid-state disk drive(s), etc. While in the illustrated example thedatastore 120 is illustrated as a single datastore, the datastore 120may be implemented by any number and/or type(s) of datastores.Furthermore, the data stored in the datastore 120 may be in any dataformat such as, for example, binary data, comma delimited data, tabdelimited data, structured query language (SQL) structures, etc.

The computing system 102 is in communication with the user interface124. For example, the user interface 124 may be implemented by agraphical user interface (GUI), an application display, etc., which maybe presented to a user on one or more display devices in circuit withand/or otherwise in communication with the computing system 102. In suchexamples, a user (e.g., a customer, a developer, a vehicle maintenancetechnician, a vehicle driver, a vehicle passenger, etc.) controls thecomputing system 102 via the user interface 124. Alternatively, thecomputing system 102 may include and/or otherwise implement the userinterface 124.

One(s) of the LCL 104A, the CPU 106, the first acceleration resource108, the second acceleration resource 110, the general purposeprocessing resource 112, the interface resource 114, the power source118, and the datastore 120 are in communication with the bus 116. Forexample, the bus 116 corresponds to, is representative of, and/orotherwise includes at least one of a CAN bus, an Inter-IntegratedCircuit (I2C) bus, a Serial Peripheral Interface (SPI) bus, a PeripheralComponent Interconnect (PCI) bus, or a JTAG interface. Additionally oralternatively, the bus 116 may implement any other type of computing orelectrical bus.

The network 126 is the Internet. However, the network 126 of thisexample may be implemented using any suitable wired and/or wirelessnetwork(s) including, for example, one or more data buses, one or moreLocal Area Networks (LANs), one or more wireless LANs (WLANs), one ormore cellular networks, one or more private networks, one or more publicnetworks, etc. In some examples, the network 126 enables the computingsystem 102 to be in communication with the central facility 128.

The central facility 128 is implemented by one or more servers thatcollect and process the lockstep debug data 122 from the computingsystem 102. Additionally or alternatively, the central facility 128 mayinclude, correspond to, and/or otherwise be representative of, any othertype of computing device, such as a desktop computer, a mobile device(e.g., a smartphone, an Internet-enabled smartphone, etc.), a laptopcomputer, a tablet (e.g., a tablet computer, an Internet-enabled tabletcomputer, etc.), etc.

In some examples, the central facility 128 may obtain the lockstep debugdata 122 from the computing system 102 via the network 126 by way of anInternet interface to receive Internet messages (e.g., HyperTextTransfer Protocol (HTTP) request(s)) that include the lockstep debugdata 122. Additionally or alternatively, the central facility 128 mayreceive the lockstep debug data 122 from the computing system 102 viathe network 126 by utilizing any other communication protocol such as anHTTP Secure protocol (HTTPS), a file transfer protocol (FTP), a securefile transfer protocol (SFTP), etc. In some examples, the centralfacility 128 may analyze the lockstep debug data 122 to identify faultconditions of the computing system 102 detected by the LCL 104. Thecentral facility 128 may identify improvement(s) to the LCL 104 based onthe identified fault conditions and subsequent analysis.

In some examples, the LCL 104 includes redundant hardware and one ormore comparators for detection of lockstep fault conditions. Forexample, the LCL 104 may include a redundant or separate instance of theCPU 106, a redundant or separate instance of the first accelerationresource 108, a redundant or separate instance of the secondacceleration resource 110, etc. For example, the LCL 104 may include aninstance of the CPU 106 and one or more comparators. In some examples,the LCL 104 may execute instructions substantially in parallel withanother resource of the computing system 102. For example, the LCL 104and the CPU 106 (or cores thereof) may execute the same instructions togenerate their respective outputs, which become the bases for comparisonto detect the fault condition(s).

In some examples, one or more of the CPU 106, the first accelerationresource 108, the second acceleration resource 110, the general purposeprocessing resource 112, and/or the interface resource 114 is/arelockstep hardware. For example, the CPU 106 may be a lockstep CPU, thefirst acceleration resource 108 may be a lockstep GPU, etc. In someexamples, the CPU 106 is a lockstep CPU and the LCL 104 performsself-test of the lockstep capabilities, functionality, etc., of the CPU106. For example, the LCL 104 may include one or more comparators (e.g.,lockstep comparators) that may compare first outputs of one or morecores of the CPU 106, and/or, more generally, the CPU 106, to secondoutputs of the LCL 104, which may include another instance of the CPU106, to detect lockstep failure. In some examples, the LCL 104 maydetect the lockstep failure in response to a detection of a faultcondition.

In some examples, the LCL 104 implements relatively fast diagnosticexecution. For example, the LCL 104 may complete a self-test of thelockstep of the CPU 106 in 8 CPU cycles compared to thousands of CPUcycles that may be needed by prior lockstep testing techniques. In someexamples, the LCL 104 enables a corresponding resource to always beonline. For example, the LCL 104 may execute a self-test of the lockstepof the CPU 106 while the CPU 106 is online and/or otherwise executingapplication code, instructions, etc. In some examples, the LCL 104 maygenerate comprehensive information that may be used to debug lockstepfailure and output the comprehensive information as the lockstep debugdata 122. For example, the LCL 104 may generate and/or otherwise outputthe lockstep debug data 122 to include highly-granular data, such as anidentification of a port (e.g., an integrated circuit port, a hardwareport, etc.) that failed the self-test, a program counter value (e.g., aregister in the CPU 106 that includes the address or location of theinstruction being executed at a specified time) in response to adetection of a fault condition, etc. In some examples, the LCL 104 mayfreeze a compare state in response to the detection of the faultcondition and may make the compare state readable (e.g., present thecompare state on the user interface 124, store the compare state in thelockstep debug data 122, etc.), latching the program counter value ofthe CPU 106, etc., and/or a combination thereof.

FIG. 2 is a block diagram of an example lockstep wrapper 200. Thelockstep wrapper 200 is a logical construct associated with one or moreportions of a system, such as the computing system 102 of FIG. 1 . Forexample, the lockstep wrapper 200 may be implemented by hardware,software, firmware and/or a combination thereof. In some examples, thelockstep wrapper 200 may implement the LCL 104 and the CPU 106 of FIG. 1. Alternatively, the lockstep wrapper 200 may implement the LCL 104 andany other resource of the computing system 102, such as the firstacceleration resource 108, the second acceleration resource 110, etc.

The lockstep wrapper 200 includes example primary hardware 202, examplesecondary hardware 204, example input delay logic 206, example outputdelay logic 208, and example lockstep compare-control logic 210. In thisexample, the lockstep compare-control logic 210 includes self-testcontrol logic 212, first example comparator logic 214, second examplecomparator logic 216, and example memory 218. In this example, thememory 218 includes the lockstep debug data 220.

Inputs of the primary hardware 202 are coupled to another resource of acomputing system (e.g., the computing system 102) via a bus (e.g., thebus 116 of FIG. 1 ). Outputs of the primary hardware 202 are coupled tothe output delay logic 208 and/or another resource of the computingsystem via the bus. As used herein, couplings associated with an inputand/or output of a component, a device, an integrated circuit, or thelike, may be implemented by one or more terminals. For example, a firstoutput terminal, a second output terminal, etc., of the primary hardware202 may be coupled to a respective one of a first input terminal, asecond input terminal, etc., of the output delay logic 208. In someexamples, the one or more terminals may be constructed with and/orotherwise be composed of aluminum, copper, etc., or any other conductivematerial or combination thereof. In some examples, the one or moreterminals may be implemented as pins (e.g., integrated circuit pins).Alternatively, the one or more terminals may be implemented as legs(e.g., conductive legs), lugs (e.g., conductive lugs), or any other typeof electrical contact.

Outputs of the output delay logic 208 are coupled to inputs of the firstcomparator logic 214, inputs of the second comparator logic 216, and/or,more generally, inputs of the lockstep compare-control logic 210. Inputsof the input delay logic 206 may be coupled to another resource of thecomputing system via the bus. Outputs of the input delay logic 206 arecoupled to inputs of the secondary hardware 204. Outputs of thesecondary hardware 204 are coupled to inputs of the first comparatorlogic 214, inputs of the second comparator logic 216, and/or, moregenerally, inputs of the lockstep compare-control logic 210. Outputs ofthe self-test control logic 212 are coupled to the inputs of the firstcomparator logic 214 and the inputs of the second comparator logic 216.Outputs of the first comparator logic 214 are coupled to inputs of thememory 218. Outputs of the second comparator logic 216 are coupled toinputs of the memory 218. Additionally or alternatively, outputs of thefirst comparator logic 214 and/or the second comparator logic 216 may becoupled to the primary hardware 202, the second hardware 204, and/or adifferent resource of the computing system via the bus.

In some examples, the primary hardware 202 may implement a resource ofthe computing system 102. For example, the primary hardware 202 mayimplement the CPU 106. Alternatively, the primary hardware 202 may beimplemented by and/or otherwise correspond to the first accelerationresource 108, the second acceleration resource 110, etc., of FIG. 1 . Insome examples, the secondary hardware 204 may implement a redundantand/or otherwise a separate instance of the primary hardware 202. Forexample, the secondary hardware 204 may be implemented by anotherinstance of the CPU 106. Alternatively, the secondary hardware 204 maybe implemented by and/or otherwise correspond to the first accelerationresource 108, the second acceleration resource 110, etc., of FIG. 1 .

In some examples, the self-test control logic 212 may be implemented bya hardware state machine. Alternatively, the self-test control logic 212may be implemented by one or more analog or digital circuit(s), logiccircuits, programmable processor(s), programmable controller(s),ASIC(s), PLD(s), and/or FPLD(s). In some examples, the memory 218 may beimplemented by non-volatile memory, volatile memory, etc. In someexamples, the lockstep debug data 220 may be implemented by the lockstepdebug data 122 of FIG. 1 .

In this example, the secondary hardware 204 is redundant hardware withrespect to the primary hardware 202. In this example, the secondaryhardware 204 is configured in a lockstep configuration. For example, thesecondary hardware 204 may obtain the same inputs as the primaryhardware 202, which, in this example, correspond to example functionalinputs 222. For example, the functional inputs 222 may be implemented bycomputer, machine, and/or otherwise hardware readable instructions. Insome examples, the primary module 202 outputs example functional outputs224 in response to executing the functional inputs 222. In someexamples, the secondary module 204 outputs example lockstep outputs 226in response to executing the functional inputs 222.

The lockstep wrapper 200 includes the input delay logic 206 to insert adelay (e.g., a time or timing delay) between the primary hardware 202receiving the functional inputs 222 and the secondary hardware 204receiving the functional inputs 222. For example, the input delay logic206 may insert the delay to ensure that the data, the signals, etc.,being compared by the first comparator logic 214, the second comparatorlogic 216, etc., are time aligned. In such examples, the input delaylogic 206 may insert the delay to mitigate and/or otherwise reducecomparator errors in response to intermittent processing delays,propagation delays, etc., associated with one or more components of thelockstep wrapper 200, and/or, more generally, the computing system 102of FIG. 1 . In some examples, the input delay logic 206 may beimplemented by one or more analog circuits, one or more or digitalcircuits, one or more logic circuits, etc.

The lockstep wrapper 200 includes the output delay logic 208 to insert adelay (e.g., a time or timing delay) between the primary hardware 202outputting the functional outputs 224 and the lockstep compare-controllogic 210 receiving the functional outputs 224. For example, the outputdelay logic 208 may insert the delay to ensure that the data, thesignals, etc., being compared by the first comparator logic 214, thesecond comparator logic 216, etc., are time aligned. In such examples,the output delay logic 208 may insert the delay to mitigate and/orotherwise reduce comparator errors in response to intermittentprocessing delays, propagation delays, etc., associated with one or morecomponents of the lockstep wrapper 200, and/or, more generally, thecomputing system 102 of FIG. 1 . In some examples, the output delaylogic 208 may be implemented by one or more analog circuits, one or moreor digital circuits, one or more logic circuits, etc.

In example operation, the primary hardware 202 receives the functionalinputs 222 at a first time and the secondary hardware 204 receives thefunctional inputs 222 at a second time after the first time. Forexample, the time difference between the first time and the second timeis implemented by the input delay logic 206. The primary hardware 202may generate the functional outputs 224 based on the functional inputs222 and the secondary hardware 204 may generate the lockstep outputs 226based on the functional inputs 222.

In example operation, the self-test control logic 212 may select (i) thefirst comparator logic 214 to execute functional comparisons of thefunctional outputs 224 and the lockstep outputs 226 to test the lockstepand (ii) the second comparator logic 216 to execute a self-test of thesecond comparator logic 216. Advantageously, the self-test control logic212 may keep the lockstep online during self-testing by enabling atleast one of the first comparator logic 214 or the second comparatorlogic 216 to execute functional comparisons during self-testing.

In example operation, the first comparator logic 214 may be utilized tocompare the functional outputs 224 and the lockstep outputs 226 toexecute functional comparisons (e.g., whether the outputs match) to testthe comparing functionality of the lockstep compare-control logic 210.In example operation, the second comparator logic 216 may perform aself-test of the second comparator logic 216. For example, the self-testcontrol logic 212 may output all logic zeros (or all logic ones) to thesecond comparator logic 216 to effectuate a match test. For example, thematch test may be implemented by comparing a first set of logic zerosfrom the self-test control logic 212 to a second set of logic zeros fromthe self-test control logic 212. In some such examples, the match testmay indicate whether one or more logic gates of the second comparatorlogic 216 are stuck and/or otherwise frozen in a logic one state (e.g.,always outputting a logic one), a logic zero state (e.g., alwaysoutputting a logic zero), etc.

In some examples, the self-test logic control 212 may output all logicones to the second comparator logic 216 during a first cycle (e.g., afirst clock cycle) or first time period to determine whether one or morelogic gates of the second comparator logic 216 are stuck in a logic zerostate. In some examples, the self-test control logic 212 may output alllogic zeros to the second comparator logic 216 during a second cycle(e.g., a second clock cycle) after the first cycle to determine whetherone or more logic gates of the second comparator logic 216 are stuck ina logic one state. For example, the match test may be implemented in twoclock cycles by outputting all logic ones during the first cycle andoutputting all logic zeros during the second cycle.

In some examples, the self-test control logic 212 may output acombination of values to the second comparator logic 216 to effectuate amismatch test. For example, the mismatch test may indicate whether oneor more logic gates of the second comparator logic 216 are stuck and/orotherwise frozen in a logic one state (e.g., always outputting a logicone), a logic zero state (e.g., always outputting a logic zero), etc. Insome examples, the self-test control logic 212 may output logic ones tofirst input(s) of logic gates and logic zeros to second input(s) of thelogic gates of the second comparator logic 216 during a first cycle(e.g., a first clock cycle) to determine whether one or more of thelogic gates, are stuck in a logic zero (or logic one) state. In someexamples, the self-test control logic 212 may output logic zeros to thefirst input(s) of the logic gates and logic ones to the second input(s)of the logic gates of the second comparator logic 216 during a secondcycle (e.g., a second clock cycle) to determine whether one or more ofthe logic gates are stuck in a logic zero (or logic one) state. Forexample, the mismatch test may be implemented in two clock cycles by (i)outputting logic ones to the first input(s) of the logic gates and logiczeros to the second input(s) of the logic gates during the first cycleand (ii) outputting logic zeros to the first input(s) of the logic gatesand logic ones to the second input(s) of the logic gates during thesecond cycle.

In example operation, in response to the second comparator logic 216detecting a fault condition associated with the second comparator logic216 based on a failing of at least one of the match test or the mismatchtest, the second comparator 216 may output the fault condition, alatching of a program counter value, etc., to the lockstep debug data220 of the memory 218. In example operation, the lockstepcompare-control logic 210 may make the lockstep debug data 220 availablefor retrieval by a resource of the computing system 102 via the bus. Inexample operation, in response to the self-test executed by the secondcomparator logic 216, the self-test control logic 212 may select (i) thesecond comparator logic 216 to execute functional comparisons of thefunctional outputs 224 and the lockstep outputs 226 to check thefunctionality and (ii) the first comparator logic 214 to execute aself-test of first comparator logic 214.

While an example manner of implementing the LCL 104 of FIG. 1 isillustrated in FIG. 2 , one or more of the elements, processes and/ordevices illustrated in FIG. 2 may be combined, divided, re-arranged,omitted, eliminated and/or implemented in any other way. Further, theexample primary hardware 202, the example secondary hardware 204, theexample input delay logic 206, the example output delay logic 208, theexample lockstep compare-control logic 210, the example self-testcontrol logic 212, the first example comparator logic 214, the secondexample comparator logic 216, the example memory 218, the examplelockstep debug data 220, and/or, more generally, the example lockstepwrapper 200 of FIG. 2 may be implemented by hardware, software, firmwareand/or any combination of hardware, software and/or firmware. Thus, forexample, any of the example primary hardware 202, the example secondaryhardware 204, the example input delay logic 206, the example outputdelay logic 208, the example lockstep compare-control logic 210, theexample self-test control logic 212, the first example comparator logic214, the second example comparator logic 216, the example memory 218,the example lockstep debug data 220, and/or, more generally, the examplelockstep wrapper 200 could be implemented by one or more analog ordigital circuit(s), logic circuits, programmable processor(s),programmable controller(s), GPU(s), DSP(s), ASIC(s), PLD(s), and/orFPLD(s). When reading any of the apparatus or system claims of thispatent to cover a purely software and/or firmware implementation, atleast one of the example primary hardware 202, the example secondaryhardware 204, the example input delay logic 206, the example outputdelay logic 208, the example lockstep compare-control logic 210, theexample self-test control logic 212, the first example comparator logic214, the second example comparator logic 216, the example memory 218,and/or the example lockstep debug data 220 is/are hereby expresslydefined to include a non-transitory computer readable storage device orstorage disk such as a memory, a DVD, a CD, a Blu-ray disk, etc.including the software and/or firmware. Further still, the example LCL104 of FIG. 1 may include one or more elements, processes and/or devicesin addition to, or instead of, those illustrated in FIG. 2 , and/or mayinclude more than one of any or all of the illustrated elements,processes and devices. As used herein, the phrase “in communication,”including variations thereof, encompasses direct communication and/orindirect communication through one or more intermediary components, anddoes not require direct physical (e.g., wired) communication and/orconstant communication, but rather additionally includes selectivecommunication at periodic intervals, scheduled intervals, aperiodicintervals, and/or one-time events.

FIG. 3 is a schematic illustration of example comparator logic 300. Thecomparator logic 300 may be an example implementation of the firstcomparator logic 214 of FIG. 2 , the second comparator logic 216 of FIG.2 , and/or, more generally, the LCL 104 of FIG. 1 . The comparator logic300 includes first example latch logic 302, example selection logic 304,first example detection logic 306, second example detection logic 308,second example latch logic 310, and example error detection logic 312.

The comparator logic 300 includes the first latch logic 302 to latchinputs from example buses 314, 316 to the selection logic 304. The buses314, 316 include a first example bus (CMP _BUS1) 314 and a secondexample bus (CMP _BUS2) 316. For example, the first bus 314 may beimplemented by the outputs from the output delay logic 208 of FIG. 2 .In some examples, the second bus 316 may be implemented by the lockstepoutputs 226 from the secondary hardware 204 of FIG. 2 . The first latchlogic 302 includes a first example latch 318 and a second example latch320. The first latch 318 and the second latch 320 are D flip-flops.Alternatively, the first latch 318 and/or the second latch 320 may beimplemented with any other type of latch or flip-flop. An input of thefirst latch 318 is coupled to the first bus 314 and an input of thesecond latch 320 is coupled to the second bus 316.

The comparator logic 300 includes the selection logic 304 to selectwhether the comparator logic 300 is to perform functional comparisons(e.g., lockstep tests, online lockstep testing, etc.) or self-testsbased on a command, an instruction, etc., from example self-test controllogic 322. In some examples, the self-test logic control logic 322 mayimplement the self-test control logic 212 of FIG. 2 . In some examples,the self-test control logic 322 may be implemented by a hardware statemachine. Alternatively, the self-test control logic 322 may beimplemented by one or more analog or digital circuit(s), logic circuits,programmable processor(s), programmable controller(s), ASIC(s), PLD(s),and/or FPLD(s).

The selection logic 304 includes a plurality of example multiplexers324, 326, 328, 330, which include a first example multiplexer 324, asecond example multiplexer 326, a third example multiplexer 328, and afourth example multiplexer 330. The plurality of multiplexers 324, 326,328, 330 include a first set of multiplexers and a second set ofmultiplexers. The first set of multiplexers include a first portion ofthe plurality of the multiplexers 324, 326, 328, 330. The first portionincludes the first multiplexer 324 and the second multiplexer 326. Thesecond set of multiplexers include a second portion of the plurality ofthe multiplexers 324, 326, 328, 330. The second portion includes thethird multiplexer 328 and the fourth multiplexer 330.

Respective first inputs of the first set of the plurality of themultiplexers 324, 326, 328, 330 are coupled to an output of the firstlatch 318. Respective second inputs of the first set of the plurality ofthe multiplexers 324, 326, 328, 330 are coupled to respective outputs ofthe self-test control logic 322. Respective first inputs of the secondset of the plurality of the multiplexers 324, 326, 328, 330 are coupledto an output of the second latch 320. Respective second inputs of thesecond set of the plurality of the multiplexers 324, 326, 328, 330 arecoupled to respective outputs of the self-test control logic 322.

Only four multiplexers of the selection logic 304 are depicted in FIG. 3for clarity. Alternatively, fewer or more multiplexers may be used toimplement the selection logic 304 than those depicted in FIG. 3 . Forexample, the number of the plurality of the multiplexers 324, 326, 328,330 may correspond to a number of outputs from a resource to be tested.In some examples, the number of the plurality of the multiplexers 324,326, 328, 330 may be equal to and/or otherwise correspond to twice anumber of outputs to be tested from the primary hardware 202 of FIG. 2 .

The comparator logic 300 includes the first detection logic 306 todetect differences between outputs of the selection logic 304. The firstdetection logic 306 includes a plurality of first example logic gates332, 334. The logic gates 332, 334 are exclusive-or (XOR) logic gates.Alternatively, one or more of the logic gates 332, 334 may be adifferent type of logic gate. The plurality of the first logic gates332, 334 include a first example logic gate 332 and a second examplelogic gate 334. Respective first inputs of the logic gates 332, 334 arecoupled to respective outputs of the first set of the plurality of themultiplexers 324, 326, 328, 330. For example, a first input of the firstlogic gate 332 is coupled to an output of the first multiplexer 324 anda first input of the second logic gate 334 is coupled to an output ofthe second multiplexer 326. Respective second inputs of the logic gates332, 334 are coupled to respective outputs of the second set of theplurality of the multiplexers 324, 326, 328, 330. For example, a secondinput of the first logic gate 332 is coupled to an output of the thirdmultiplexer 328 and a second input of the second logic gate 334 iscoupled to an output of the fourth multiplexer 330.

Only two logic gates of the first detection logic 306 are depicted inFIG. 3 for clarity. Alternatively, fewer or more logic gates may be usedto implement the first detection logic 306 than those depicted in FIG. 3. For example, the number of the first logic gates 332, 334 maycorrespond to N/2 logic gates, where N is the number of the plurality ofthe multiplexers 324, 326, 328, 330. In some examples, the number of thefirst logic gates 332, 334 may be equal to and/or otherwise correspondto the number of the outputs to be tested from the primary hardware 202of FIG. 2 .

The comparator logic 300 includes the second detection logic 308 todetect whether there is at least one logic one from the outputs of thefirst detection logic 306. The second detection logic 308 include secondexample logic gates 336, 338, which include a third example logic gate336 and a fourth example logic gate 338. The third logic gate 336 is anOR logic gate. The fourth logic gate 338 is a not-and (NAND) logic gate.Alternatively, the third logic gate 336 and/or the fourth logic gate 338may be implemented with a different type and/or quantity of logic gates.Respective first inputs of the third logic gate 336 are coupled torespective outputs of the first logic gates 332, 334. For example, afirst input of the third logic gate 336 is coupled to an output of thefirst logic gate 332 and a second input of the third logic gate 336 iscoupled to an output of the second logic gate 334. Respective inputs ofthe fourth logic gate 338 are coupled to respective outputs of the firstlogic gates 332, 334. For example, a first input of the fourth logicgate 338 is coupled to an output of the first logic gate 332 and asecond input of the fourth logic gate 338 is coupled to an output of thesecond logic gate 334.

The comparator logic 300 includes the second latch logic 310 to latchoutputs from the second detection logic 308 to the error detection logic312. The second latch logic 310 includes a third example latch 340 and afourth example latch 342. The third latch 340 and the fourth latch 342are D flip-flops. Alternatively, the third latch 340 and/or the fourthlatch 342 may be implemented with any other type of latch or flip-flop.An input of the third latch 340 is coupled to an output of the thirdlogic gate 336. An input of the fourth latch 342 is coupled to an outputof the fourth logic gate 338.

The comparator logic 300 includes the error detection logic 312 todetect a fault condition or error in connection with lockstep operation,functionality, etc., of the lockstep wrapper 200 of FIG. 2 . The errordetection logic 312 includes a fifth example logic gate 344, a sixthexample logic gate 346, a seventh example logic gate 348, and an eighthexample logic gate 350. The fifth logic gate 344, the sixth logic gate346, and the seventh logic gate 348 are AND logic gates. Alternatively,one or more of the fifth logic gate 344, the sixth logic gate 346,and/or the seventh logic gate 348 may be implemented by a different typeand/or quantity of logic gates. The eighth logic gate 350 is an OR logicgate. Alternatively, the eighth logic gate 350 may be implemented with adifferent type and/or quantity of logic gates.

A first input of the fifth logic gate 344 is coupled to an output of thethird latch 340. A second input (!SELF-TEST_MODE) of the fifth logicgate 344 is coupled to external logic to the comparator logic 300. Forexample, the second input of the fifth logic gate 344 may be coupled toan output of the self-test control logic 322. For example, the secondinput may be configured to receive a first control signal implemented by!SELF-TEST_MODE. An output of the fifth logic gate 344(FUNC_COMPARE_ERROR) is coupled to external logic to the comparatorlogic 300. For example, the output of the fifth logic gate 344 may becoupled to the memory 218 of FIG. 2 .

A first input of the sixth logic gate 346 is coupled to an output of thethird latch 340. A second input (MATCH _TEST) of the sixth logic gate346 is coupled to external logic to the comparator logic 300. Forexample, the second input of the sixth logic gate 346 may be coupled toan output of the self-test control logic 322. For example, the secondinput may be configured to receive a second control signal implementedby MATCH_TEST.

A first input of the seventh logic gate 348 is coupled to an output ofthe fourth latch 342. A second input (MISMATCH_TEST) of the seventhlogic gate 348 is coupled to external logic to the comparator logic 300.For example, the second input of the seventh logic gate 348 may becoupled to an output of the self-test control logic 322. For example,the second input may be configured to receive a second control signalimplemented by MISMATCH TEST.

A first input of the eighth logic gate 350 is coupled to an output ofthe sixth logic gate 346. A second input of the eighth logic gate 350 iscoupled to an output of the seventh logic gate 348. An output of theeighth logic gate 350 (SELF-TEST_ERROR) may be coupled to external logicto the comparator logic 300. For example, the output of the eighth logicgate 350 may be coupled to the memory 218 of FIG. 2 .

In example operation, the self-test control logic 322 may select whetherthe comparator logic 300 is to test the lockstep or functionalcomparisons. For example, the self-test control logic 322 may instructthe selection logic 304, and/or, more generally, the comparator logic300, to test for comparisons of the functional outputs from the firstbus 314 and/or the second bus 316. In such examples, the self-testcontrol logic 322 may de-assert a self-test mode signal (SELF-TESTMODE). In such examples, the self-test control logic 322 may output asignal (e.g., a selection signal) to the plurality of the multiplexers324, 326, 328, 330 to select the inputs from the first latch 318 and thesecond latch 320 to output to the first detection logic 306. Forexample, the first logic gates 332, 334 may compare first input(s) fromthe first bus 314 to second input(s) from the second bus 316. The thirdlogic gate 336 may assert a logic one in response to at least one of theoutputs from the first logic gates 332, 334 being a logic one. Forexample, the third logic gate 336 may assert a logic one based on adetermination that one(s) of the first logic gates 332, 334 detected amismatch of one(s) of inputs from the buses 314, 316. In such examples,the fifth logic gate 344 may assert a logic one as theFUNC_COMPARE_ERROR signal based on the detected mismatch and theassertion of the signal at the second input of the fifth logic gate 344.

In some examples, the self-test control logic 322 may instruct theselection logic 304, and/or, more generally, the comparator logic 300,to execute a self-test of the comparator logic 300. In such examples,the self-test control logic 322 may assert the self-test mode signal(SELF-TEST_MODE) and assert a match test mode signal (MATCH _TEST) tocause the comparator logic 300 to perform a match test.

In some examples, the self-test control logic 322 causes the match testto be performed by the comparator logic 300 in two cycles. For example,the self-test control logic 322 may output a signal (e.g., a selectionsignal) to the plurality of the multiplexers 324, 326, 328, 330 toselect the inputs from the self-test control logic 322 to output to thefirst detection logic 306. For example, the self-test control logic 322may output a logic zero during a first cycle or a logic one during asecond cycle (after the first cycle) to each of the plurality of themultiplexers 324, 326, 328, 330 to effectuate a match test. In suchexamples, the first logic gates 332, 334 may compare the logic zerosoutput from the plurality of the multiplexers 324, 326, 328, 330 duringthe first cycle and the logic ones output from the plurality of themultiplexers 324, 326, 328, 330 during the second cycle. The third logicgate 336 may assert a logic one during the first cycle in response to atleast one of the outputs from the first logic gates 332, 334 being alogic one, which may indicate that at least one of the first logic gates332, 334 are stuck and/or otherwise latched on a logic one output state.The third logic gate 336 may assert a logic one during the second cyclein response to at least one of the outputs from the first logic gates332, 334 being a logic one, which may indicate that at least one of thefirst logic gates 332, 334 are stuck and/or otherwise latched on a logiczero output state. For example, the third logic gate 336 may assert alogic one based on a determination that one(s) of the first logic gates332, 334 are not generating outputs based on their inputs. In suchexamples, the sixth logic gate 346 may assert a logic one to the eighthlogic gate 350, which, in turn, asserts a logic one as theSELF-TEST_ERROR signal. In some such examples, the assertion of theSELF-TEST_ERROR signal indicates a detection of a fault condition of thecomparator logic 300, the indication of which may be stored as thelockstep debug data 220 in the memory 218 of FIG. 2 .

In some examples, the self-test control logic 322 may assert theself-test mode signal (SELF-TEST_MODE) and assert a mismatch test modesignal (MISMATCH TEST) to cause the comparator logic 300 to perform amismatch test. In such examples, the self-test control logic 322 mayoutput a signal (e.g., a selection signal) to the plurality of themultiplexers 324, 326, 328, 330 to select the inputs from the self-testcontrol logic 322 to output to the first detection logic 306. Forexample, the self-test control logic 322 may output during a first cyclea logic one to the first portion of the multiplexers 324, 326, 328, 330,such as the first multiplexer 324 and the second multiplexer 326, and alogic zero to the second portion of the multiplexers 324, 326, 328, 330,such as the third multiplexer 328 and the fourth multiplexer 330. Insuch examples, the self-test control logic 322 may output during asecond cycle (after the first cycle) a logic zero to the first portionof the multiplexers 324, 326, 328, 330, such as the first multiplexer324 and the second multiplexer 326, and a logic one to the secondportion of the multiplexers 324, 326, 328, 330, such as the thirdmultiplexer 328 and the fourth multiplexer 330. In some such examples,the self-test control logic 322 may effectuate a mismatch test based onthe forcing of these two different values (e.g., the logic zero(s), thelogic one(s), etc.) during the two cycles.

In such examples, the first logic gates 332, 334 may compare the logicoutputs from the plurality of the multiplexers 324, 326, 328, 330. Thefourth logic gate 338 may assert a logic one in response to at least oneof the outputs from the first logic gates 332, 334 being a logic zero,which may indicate that at least one of the first logic gates 332, 334are stuck and/or otherwise latched on a logic zero output state. Forexample, the fourth logic gate 338 may assert a logic one based on adetermination that one(s) of the first logic gates 332, 334 are notgenerating outputs based on their inputs. In such examples, the seventhlogic gate 348 may assert a logic one to the eighth logic gate 350,which, in turn, asserts a logic one as the SELF-TEST_ERROR signal. Insome such examples, the assertion of the SELF-TEST_ERROR signalindicates a detection of a fault condition of the comparator logic 300,the indication of which may be stored as the lockstep debug data 220 inthe memory 218 of FIG. 2 . Advantageously, the self-test control logic322 may effectuate a complete self-test of the comparator logic 300 infour cycles based on completing the match test in two cycles andcompleting the mismatch test in two cycles.

FIGS. 4A-4B are schematic illustrations of example dual comparator logic400. The dual comparator logic 400 may be an example implementation ofthe first comparator logic 214 of FIG. 2 and the second comparator logic216 of FIG. 2 , and/or, more generally, the LCL 104 of FIG. 1 . The dualcomparator logic 400 includes first example comparator logic 402 andsecond example comparator logic 404. For example, the first comparatorlogic 402 may implement the first comparator logic 214 of FIG. 2 and/orthe second comparator logic 216 of FIG. 2 . In some examples, the secondcomparator logic 404 may implement the first comparator logic 214 ofFIG. 2 and/or the second comparator logic 216 of FIG. 2 .

Further depicted in FIGS. 4A and/or 4Bis example self-test control logic405. In some examples, the self-test control logic 405 may implement theself-test control logic 212 of FIG. 2 and/or the self-test control logic322 of FIG. 3 . In some examples, the self-test control logic 405 may beimplemented by a hardware state machine. Alternatively, the self-testcontrol logic 405 may be implemented by one or more analog or digitalcircuit(s), logic circuits, programmable processor(s), programmablecontroller(s), ASIC(s), PLD(s), and/or FPLD(s). In this example, outputsof the self-test control logic 405 are coupled to inputs of the firstcomparator logic 402 and the second comparator logic 404. In someexamples, the dual comparator logic 400 may include the self-testcontrol logic 405.

The first comparator logic 402 includes a first example latch 406, firstexample selection logic 408, first example detection logic 410, secondexample detection logic 412, a second example latch 414, a third examplelatch 416, and first example error detection logic 418. The firstselection logic 408 includes a first set of example multiplexers 420,422 including a first example multiplexer 420 and a second examplemultiplexer 422. The first selection logic 408 includes a second set ofexample multiplexers 424, 426 including a third example multiplexer 424and a fourth example multiplexer 426. The first detection logic 410includes first example logic gates 428, 430 including a first examplelogic gate 428 and a second example logic gate 430. The second detectionlogic 412 includes a third example logic gate 432 and a fourth examplelogic gate 434. The first error detection logic 418 includes a fifthexample logic gate 436, a sixth example logic gate 438, a seventhexample logic gate 440, an eighth example logic gate 442, a ninthexample logic gate 444, and a tenth example logic gate 446.

Only four multiplexers of the first selection logic 408 are depicted inFIGS. 4A-4B for clarity. Alternatively, fewer or more multiplexers maybe used to implement the first selection logic 408 than those depictedin FIGS. 4A-4B. For example, the number of the first set of multiplexers420, 422 and/or the number of the second set of multiplexers 424, 426may correspond to a number of outputs from a resource to be tested. Insome examples, the number of the first set of multiplexers 420, 422and/or the number of the second set of multiplexers 424, 426 may beequal to and/or otherwise correspond to twice a number of outputs to betested from the primary hardware 202 of FIG. 2 .

Only two logic gates of the first detection logic 410 are depicted inFIGS. 4A-4B for clarity. Alternatively, fewer or more logic gates may beused to implement the first detection logic 410 than those depicted inFIGS. 4A-4B. For example, the number of the first logic gates 428, 430may correspond to N/2 logic gates, where N is the number of themultiplexers 420, 422, 424, 426 of the first selection logic 408. Insome examples, the number of the first logic gates 428, 430 may be equalto and/or otherwise correspond to the number of the outputs to be testedfrom the primary hardware 202 of FIG. 2 .

The second comparator logic 404 includes a fourth example latch 448,second example selection logic 450, third example detection logic 452,fourth example detection logic 454, a fifth example latch 456, a sixthexample latch 458, and second example error detection logic 460. Thesecond selection logic 450 includes a third example set of multiplexers462, 464 including a fifth example multiplexer 462 and a sixth examplemultiplexer 464. The second selection logic 450 includes a fourthexample set of multiplexers 466, 468 including a seventh examplemultiplexer 466 and an eighth example multiplexer 468. The thirddetection logic 452 includes second example logic gates 470, 472including a first example logic gate 470 and a second example logic gate472. The second detection logic 454 includes a third example logic gate474 and a fourth example logic gate 476. The second error detectionlogic 460 includes a fifth example logic gate 478, a sixth example logicgate 480, a seventh example logic gate 482, an eighth example logic gate484, a ninth example logic gate 486, and a tenth example logic gate 488.

Only four multiplexers of the second selection logic 450 are depicted inFIGS. 4A-4B for clarity. Alternatively, fewer or more multiplexers maybe used to implement the second selection logic 450 than those depictedin FIGS. 4A-4B. For example, the number of the third set of multiplexers462, 464 and/or the number of the fourth set of multiplexers 466, 468may correspond to a number of outputs from a resource to be tested. Insome examples, the number of the third set of multiplexers 462, 464and/or the number of the fourth set of multiplexers 466, 468 may beequal to and/or otherwise correspond to twice a number of outputs to betested from the primary hardware 202 of FIG. 2 .

Only two logic gates of the third detection logic 470 are depicted inFIGS. 4A-4B for clarity. Alternatively, fewer or more logic gates may beused to implement the third detection logic 470 than those depicted inFIGS. 4A-4B. For example, the number of the second logic gates 470, 472may correspond to N/2 logic gates, where N is the number of themultiplexers 462, 464, 466, 468 of the second selection logic 450. Insome examples, the number of the second logic gates 470, 472 may beequal to and/or otherwise correspond to the number of the outputs to betested from the primary hardware 202 of FIG. 2 .

The first latch 406, the second latch 414, the third latch 416, thefourth latch 448, the fifth latch 456, and the sixth latch 458 are Dflip-flops. Alternatively, the first latch 318 and/or the second latch320 may be implemented with any other type of latch or flip-flop. Thefirst logic gates 428, 430 and the second logic gates 470, 472 are XORlogic gates. The third logic gate 432 of the second detection logic 412and the third logic gate 474 of the fourth detection logic 454 are ORlogic gates. The fourth logic gate 434 of the second detection logic 412and the fourth logic gate 476 of the fourth detection logic 454 are NANDlogic gates. The fifth logic gate 436, the sixth logic gate 438, theseventh logic gate 440, and the ninth logic gate 444 of the first errordetection logic 418 are AND gates. The eighth logic gate 442 of thefirst error detection logic 418 and the eighth logic gate 484 of thesecond error detection logic 460 are inverter logic gates. The tenthlogic gate 446 of the first error detection logic 418 and the tenthlogic gate 488 of the second error detection logic 460 are OR gates.Alternatively, one or more of the logic gates of the first comparatorlogic 402 and/or one or more of the logic gates of the second comparatorlogic 404 may be implemented with different types and/or quantities oflogic gates than depicted in the illustrated example of FIGS. 4A-4B.

The first comparator logic 402 includes the first latch 406 to latchinputs from a first example bus (CMP_BUS1) 489 to the first selectionlogic 408. In some examples, the first bus 489 may be implemented by theoutputs from the output delay logic 208 of FIG. 2 . The first comparatorlogic 402 includes the first selection logic 408 to select whether thefirst comparator logic 402 is to perform functional comparisons (e.g.,lockstep tests, online lockstep testing, etc.) or self-tests based on acommand, an instruction, etc., from example self-test control logic(e.g., the self-test control logic 212 of FIG. 2 , the self-test controllogic 322 of FIG. 3 , etc.).

Respective first inputs of ones of the first set of multiplexers 420,422 are coupled to the first latch 406. Respective second inputs of theones of the first set of multiplexers 420, 422 are coupled to theself-test control logic 405. Respective outputs of the ones of the firstset of multiplexers 420, 422 are coupled to respective first inputs ofthe first logic gates 428, 430. For example, a first input of the firstlogic gate 428 is coupled to an output of the first multiplexer 420 anda first input of the second logic gate 430 is coupled to an output ofthe second multiplexer 422. For example, a second input of the firstlogic gate 428 is coupled to an output of the fifth multiplexer 462 anda second input of the second logic gate 430 is coupled to an output ofthe sixth multiplexer 464.

The first comparator logic 402 includes the first detection logic 410 todetect differences between outputs of the first selection logic 408.Outputs of the first logic gates 428, 430 are coupled to inputs of thethird logic gate 432 and the fourth logic gate 434. For example,output(s) of the first logic gate 428 is coupled to a first input of thethird logic gate 432 and a first input of the fourth logic gate 434.

The first comparator logic 402 includes the second detection logic 412to detect whether there is at least one logic one from the outputs ofthe first detection logic 410. Outputs of the third logic gate 432 andthe fourth logic gate 434 are coupled to respective inputs of the secondlatch 414 and the third latch 416. For example, an output of the thirdlogic gate 432 is coupled to an input of the second latch 414 and anoutput of the fourth logic gate 434 is coupled to an input of the thirdlatch 416.

Outputs of the second latch 414 are coupled to a first input of thefifth logic gate 436 and a first input of the sixth logic gate 438.Outputs of the third latch 416 are coupled to a first input of theseventh logic gate 440 and an input of the eighth logic gate 442. Anoutput of the eighth logic gate 442 is coupled to a first input of theninth logic gate 444. Outputs of the sixth logic gate 438, the seventhlogic gate 440, and the ninth logic gate 444 are coupled to respectiveinputs of the tenth logic gate 446. Outputs of the fifth logic gate 436(FUNC ₋COMPARE ERROR1) and the tenth logic gate 446 (SELF-TEST_ERROR1)may be coupled to external logic to the dual comparator logic 400. Forexample, the outputs of the fifth logic gate 436 and the tenth logicgate 446 may be coupled to the memory 218 of FIG. 2 .

The second comparator logic 404 includes the fourth latch 448 to latchinputs from a second example bus (CMP _BUS2) 490 to the second selectionlogic 450. In some examples, the second bus 490 may be implemented bythe lockstep outputs 226 from the secondary hardware 204 of FIG. 2 . Thesecond comparator logic 404 includes the second selection logic 450 toselect whether the second comparator logic 404 is to perform functionalcomparisons (e.g., lockstep tests, online lockstep testing, etc.) orself-tests based on a command, an instruction, etc., from exampleself-test control logic (e.g., the self-test control logic 212 of FIG. 2, the self-test control logic 322 of FIG. 3 , etc.).

Respective first inputs of ones of the third set of multiplexers 462,464 and the first inputs of ones of the fourth set of multiplexers 466,468 are coupled to the fourth latch 448. Respective second inputs of theones of the third set of multiplexers 462, 464 are coupled to theself-test control logic 405. Respective outputs of the ones of thefourth set of multiplexers 466, 468 are coupled to respective firstinputs of the second logic gates 470, 472. For example, a first input ofthe first logic gate 470 is coupled to an output of the thirdmultiplexer 424 and a first input of the second logic gate 472 iscoupled to an output of the fourth multiplexer 426. For example, asecond input of the first logic gate 470 is coupled to an output of theseventh multiplexer 466 and a second input of the second logic gate 472is coupled to an output of the eighth multiplexer 468.

The second comparator logic 404 includes the third detection logic 452to detect differences between outputs of the second selection logic 450.Outputs of the second logic gates 470, 472 are coupled to inputs of thethird logic gate 474 and the fourth logic gate 476. For example,output(s) of the first logic gate 470 is coupled to a first input of thethird logic gate 474 and a first input of the fourth logic gate 476.

The second comparator logic 404 includes the fourth detection logic 454to detect whether there is at least one logic one from the outputs ofthe third detection logic 452. Outputs of the third logic gate 474 andthe fourth logic gate 476 are coupled to respective inputs of the fifthlatch 456 and the sixth latch 458. For example, an output of the thirdlogic gate 474 is coupled to an input of the fifth latch 456 and anoutput of the fourth logic gate 476 is coupled to an input of the sixthlatch 458.

Outputs of the fifth latch 456 are coupled to a first input of the fifthlogic gate 478 and a first input of the sixth logic gate 480. Outputs ofthe sixth latch 458 are coupled to a first input of the seventh logicgate 482 and an input of the eighth logic gate 484. An output of theeighth logic gate 484 is coupled to a first input of the ninth logicgate 486. Outputs of the sixth logic gate 480, the seventh logic gate482, and the ninth logic gate 486 are coupled to respective inputs ofthe tenth logic gate 488. Outputs of the fifth logic gate 478(FUNC_COMPARE_ERROR2) and the tenth logic gate 488 (SELF-TEST_ERROR2)may be coupled to external logic to the dual comparator logic 400. Forexample, the outputs of the fifth logic gate 478 and the tenth logicgate 488 may be coupled to the memory 218 of FIG. 2 .

In the illustrated example of FIGS. 4A-4B, the dual comparator logic 400is implemented using at least two different clock domains. In thisexample, the fourth latch 448, the fifth latch 456, and the sixth latch458 are implemented using a first clock domain. In this example, thefirst latch 406, the second latch 414, and the third latch 416 areimplemented using a second clock domain different from the first clockdomain.

In the illustrated example of FIGS. 4A-4B, the dual comparator logic 400includes the first error detection logic 418 and the second errordetection logic 460 to detect fault condition(s) or error(s) inconnection with lockstep operation, functionality, etc., of the lockstepwrapper 200 of FIG. 2 . In this example, the dual comparator logic 400implements two test modes (TM1 and TM2). For example, the dualcomparator logic 400 may execute a self-test of the first comparatorlogic 402 to implement test mode 1 (TM1). In such examples, theself-test control logic 405, and/or, more generally, the dual comparatorlogic 400, may assert a first test mode signal (TM1) and/or deassert asecond test mode signal (TM2) in response to determining to execute theself-test of the first comparator logic 402. In some examples, the dualcomparator logic 400 may execute a self-test of the second comparatorlogic 404 to implement test mode 2 (TM2). In such examples, theself-test control logic 405, and/or, more generally, the dual comparatorlogic 400, may deassert the first test mode signal and/or assert thesecond test mode signal in response to determining to execute theself-test of the second comparator logic 404.

In some examples, a second input of the fifth logic gate 436 of thefirst error detection logic 418 (!TM1 &!COMPARATOR1_SELF-TEST_ERROR_FORCING_MODE) is coupled to the self-testcontrol logic 405. For example, the second input of the fifth logic gate436 may be coupled to an output of the self-test control logic 405. Insome examples, a signal at the second input is asserted in response tothe dual comparator logic 400 operating in TM2 (e.g., !TM1) and thefirst comparator logic 402 not undergoing self-testing (e.g.,!COMPARATOR1 _SELF-TEST ERROR FORCING MODE).

In some examples, a second input (TM1_MATCH_TEST) of the sixth logicgate 438 of the first error detection logic 418 is coupled to theself-test control logic 405. For example, the second input of the sixthlogic gate 438 may be coupled to an output of the self-test controllogic 405. In some examples, a signal at the second input may beasserted in response to the first comparator logic 402 executing aself-test of the first comparator logic 402, such as a match test. Forexample, the match test may be implemented by the first set ofmultiplexers 420, 422 and the third set of multiplexers 462, 464outputting all logic zeros (or logic ones) from the self-test controllogic 405 to test whether one(s) of the first logic gates 428, 430 arestuck and/or otherwise latched to a logic one (or logic zero) state.

In some examples, a second input (TM1_MISMATCH_TEST) of the seventhlogic gate 440 of the first error detection logic 418 is coupled to theself-test control logic 405. For example, the second input of theseventh logic gate 440 may be coupled to an output of the self-testcontrol logic 405. In some examples, a signal at the second input may beasserted in response to the first comparator logic 402 executing aself-test of the first comparator logic 402, such as a mismatch test.For example, the mismatch test may be implemented in two cycles. Forexample, during a first cycle, the first set of multiplexers 420, 422may output all logic ones from the self-test logic 405 and the third setof multiplexers 462, 464 may output all logic zeros from the self-testcontrol logic 405 to test whether one(s) of the first logic gates 428,430 are stuck and/or otherwise latched to a logic zero (or logic one)state. In such examples, during a second cycle after the first cycle,the first set of multiplexers 420, 422 may output all logic zeros fromthe self-test logic 405 and the third set of multiplexers 462, 464 mayoutput all logic ones from the self-test control logic 405 to testwhether one(s) of the first logic gates 428, 430 are stuck and/orotherwise latched to a logic zero (or logic one) state.

In some examples, a second input (!COMPARATOR1 ERROR FORCING MODE &COMPARATOR1_SELF-TEST_ERROR_FORCING_MODE) of the ninth logic gate 444 ofthe first error detection logic 418 is coupled to the self-test controllogic 405. For example, the second input may be coupled to an output ofthe self-test control logic 405. In some examples, a signal at thesecond input is asserted in response to the first comparator logic 402not operating in error forcing mode (!COMPARATOR1_ERROR_FORCING_ MODE)and the first comparator logic 402 undergoing self-testing, which may beindicated with an assertion of the signal COMPARATOR1_ SELF-TEST ERRORFORCING MODE depicted in this illustrated example.

In some examples, in response to the first comparator logic 402operating in error forcing mode, which may be implemented with anassertion of a signal COMPARATOR1_ERROR_FORCING_MODE depicted in thisillustrated example, the first comparator logic 402 may invert one ofthe functional outputs from the first bus 489. This may trigger amismatch, which may be indicated by an assertion of a logic one by thefifth logic gate 436.

In some examples, a second input, which is indicated by signals !TM2 &!COMPARATOR2_SELF-TEST_ERROR_FORCING_MODE as depicted in thisillustrated example, of the fifth logic gate 478 of the second errordetection logic 460 is coupled to the self-test control logic 405. Forexample, the second input may be coupled to an output of the self-testcontrol logic 405. In some examples, a signal at the second input isasserted in response to the dual comparator logic 400 operating in TM1,which may be implemented with the signal !TM2 as depicted in thisillustrated example, and the second comparator logic 404 not undergoingself-testing, which may be implemented by the signal!COMPARATOR2_SELF-TEST_ERROR_FORCING_MODE as depicted in thisillustrated example.

In some examples, a second input, which is indicated by the signalTM2_MATCH_TEST as depicted in this illustrated example, of the sixthlogic gate 480 of the second error detection logic 460 is coupled to theself-test control logic 405 to the dual comparator logic 400. Forexample, the second input of the sixth logic gate 480 may be coupled toan output of the self-test control logic 405. In some such examples, asignal at the second input may be asserted in response to the secondcomparator logic 404 executing a self-test of the second comparatorlogic 404, such as a match test. For example, the match test may beimplemented by the second set of multiplexers 424, 426 and the fourthset of multiplexers 466, 468 outputting all logic zeros (or logic ones)from the self-test control logic 405 to test whether one(s) of thesecond logic gates 470, 472 are stuck and/or otherwise latched to alogic one state.

In some examples, a second input, which is indicated by the signalTM2_MISMATCH_TEST as depicted in this illustrated example, of theseventh logic gate 482 of the second error detection logic 460 iscoupled to the self-test control logic 405. For example, the secondinput of the seventh logic gate 482 may be coupled to an output of theself-test control logic 405. In some examples, a signal at the secondinput may be asserted in response to the second comparator logic 404executing a self-test of the second comparator logic 404, such as amismatch test. For example, the mismatch test may be implemented by thesecond set of multiplexers 424, 426 outputting logic ones and the fourthset of multiplexers 466, 468 outputting logic zeros from the self-testcontrol logic 405 during a first cycle to test whether one(s) of thesecond logic gates 474, 476 are stuck and/or otherwise latched to alogic zero (or logic one) state. In such examples, the mismatch test maybe implemented by the second set of multiplexers 424, 426 outputtinglogic zeros and the fourth set of multiplexers 466, 468 outputting logicones from the self-test control logic 405 during a second cycle to testwhether one(s) of the second logic gates 474, 476 are stuck and/orotherwise latched to a logic zero (or logic one) state.

In some examples, a second input, which may be implemented by the signal! COMPARATOR2 ERROR FORCING MODE &COMPARATOR2₋SELF-TEST_ERROR_FORCING_MODE as depicted in this illustratedexample, of the ninth logic gate 486 of the second error detection logic460 is coupled to the self-test control logic 405. For example, thesecond input may be coupled to an output of the self-test control logic405. In some examples, a signal at the second input is asserted inresponse to the second comparator logic 404 not operating in errorforcing mode, which may be implemented by the signal!COMPARATOR2_ERROR_FORCING_MODE as depicted in this illustrated example,and the second comparator logic 404 undergoing self-testing, which maybe implemented with the signal COMPARATOR2₋SELF-TEST ERROR FORCING MODEas depicted in this illustrated example.

In some examples, in response to the second comparator logic 404operating in error forcing mode, which may be implemented with anassertion of the signal COMPARATOR2_ERROR­_FORCING_MODE depicted in thisillustrated example, the second comparator logic 404 may invert one ofthe functional outputs from the second bus 490. This may trigger amismatch, which may be indicated by an assertion of a logic one by thefifth logic gate 478.

In example operation, the self-test control logic 405, and/or, moregenerally, the dual comparator logic 400, may select whether the firstcomparator logic 402 or the second comparator logic 404 is to test thelockstep functions of the lockstep wrapper 200 of FIG. 2 . For example,the self-test control logic 405 may select the first comparator logic402 to test the lockstep functions. In such examples, the self-testcontrol logic 405 invokes and/or otherwise instructs the first set ofmultiplexers 420, 422 and the third set of multiplexers 462, 464 to passinputs from the buses 489, 490 to the first logic gates 428, 430. Insome such examples, the self-test control logic 405 may assert a signalat the second input of the fifth logic gate 436 of the first errordetection logic 418 to effectuate the test of the lockstep functions. Insome examples, the fifth logic gate 436 may output a logic low signal asthe FUNC_COMPARE_ERROR1 signal in response to the first logic gates 428,430 detecting that the inputs from the buses 489, 490 match. In someexamples, the fifth logic gate 436 may output a logic high signal as theFUNC _COMPARE - ERROR 1 signal in response to the first logic gates 428,430 detecting that the inputs from the buses 489, 490 do not match.

In example operation, the self-test control logic 405 may select thesecond comparator logic 404 to execute a self-test, which may include amatch test and/or a mismatch test. In such examples, the self-testcontrol logic 405 invokes and/or otherwise instructs the second set ofmultiplexers 424, 426 and the fourth set of multiplexers 466, 468 topass inputs from the self-test control logic 405 to the second logicgates 470, 472. In some such examples, the self-test control logic 405may deassert a signal at the second input of the fifth logic gate 436 ofthe second error detection logic 460 to effectuate the self-test.

In some examples, the self-test control logic 405 (i) outputs logiczeros (or logic ones) to the second set of multiplexers 424, 426 and thefourth set of multiplexers 466, 468 to perform the match test and (ii)asserts TM2 MATCH TEST. The sixth logic gate 480 may output a logic lowsignal to the tenth logic gate 488 in response to the second logic gates470, 472 not detecting at least one logic one from the second logicgates 470, 472, which indicates a pass of the match test. The sixthlogic gate 480 may output a logic high signal to the tenth logic gate488 in response to the second logic gates 470, 472 detecting at leastone logic one from the second logic gates 470, 472, which indicates afailure of the match test.

In some examples, the self-test control logic 405 (i) outputs logic onesto the second set of multiplexers 424, 426 and logic zeros to the fourthset of multiplexers 466, 468 during a first cycle and outputs logiczeros to the second set of multiplexers 424, 426 and logic ones to thefourth set of multiplexers 466, 468 during a second cycle (after thefirst cycle) to perform the mismatch test and (ii) assertsTM2_MISMATCH_TEST. The sixth logic gate 480 may output a logic lowsignal to the tenth logic gate 488 in response to the second logic gates470, 472 not detecting at least one logic one from the second logicgates 470, 472, which indicates a pass or successful completion of themismatch test. The sixth logic gate 480 may output a logic high signalto the tenth logic gate 488 in response to the second logic gates 470,472 detecting at least one logic one from the second logic gates 470,472, which indicates a failure or unsuccessful completion of themismatch test.

In example operation, in response to at least one of the sixth logicgate 480, the seventh logic gate 482, or the ninth logic gate 486outputting a logic one, the tenth logic gate 488 may assert a logic oneas the SELF-TEST _ERROR2 signal. In some such examples, the assertion ofthe SELF-TEST _ERROR2 signal indicates a detection of a fault conditionof the second comparator logic 402, the indication of which may bestored as the lockstep debug data 220 in the memory 218 of FIG. 2 .

In example operation, the self-test control logic 405, and/or, moregenerally, the dual comparator logic 400, may select (i) the secondcomparator logic 404 to test the lockstep functions in response to thesecond comparator logic 404 completing a self-test (e.g., successfullycompleting a self-test) and (ii) the first comparator logic 402 toexecute a self-test. Advantageously, by testing at least one of thefirst comparator logic 402 or the second comparator logic 404 at a time,the other one of the first comparator logic 402 or the second comparatorlogic 404 may remain online to test the lockstep associated with theprimary hardware 202 and the secondary hardware 204 of FIG. 2 .

FIG. 5 is a timing diagram 500 depicting example operation of theexample LCL 104 of FIG. 1 , the lockstep compare-control logic 210 ofFIG. 2 , the comparator logic 300 of FIG. 3 , and/or the dual comparatorlogic 400 of FIGS. 4A-4B. The timing diagram 500 includes examplewaveforms 502, 504, 506, 508, 510, 512, 514, 516 including a firstexample waveform 502, a second example waveform 504, a third examplewaveform 506, a fourth example waveform 508, a fifth example waveform510, a sixth example waveform 512, a seventh example waveform 514, andan eighth example waveform 516. In particular, the first waveform 502,the second waveform 504, the third waveform 506, the fifth waveform 510,and/or the sixth waveform 512 may correspond to signals associated withboth (i) a single comparator implementation (e.g., the comparator logic300 of FIG. 3 ) and (ii) a dual comparator implementation (e.g., thedual comparator logic 400 of FIGS. 4A-4B). In some examples, the fourthwaveform 508, the seventh waveform 514, and the eighth waveform 516 maycorrespond to signals associated with a second comparator in dualcomparator examples (e.g., the first comparator logic 402 and/or thesecond comparator logic 404 of the dual comparator logic 400 of FIGS.4A-4B).

The first waveform 502 implements a clock signal. For example, the firstwaveform 502 may implement the clock signals (CLK) received by the firstlatch 318, the second latch 320, the third latch 340, and/or the fourthlatch 342 of FIG. 3 . In some examples, the first waveform 502 mayimplement the clock signals (CLK) received by the first latch 406, thesecond latch 414, the third latch 416, the fourth latch 448, the fifthlatch 456, and/or the sixth latch 458 of FIGS. 4A-4B.

The second waveform 504 implements a self-test enable signal. Forexample, the self-test enable signal may be implemented by the self-testcontrol logic 212 of FIG. 2 , the self-test control logic 322 of FIG. 3, and/or the self-test control logic 405 of FIGS. 4A-4B. In someexamples, the self-test enable signal may implement the signalSELF-TEST_MODE depicted in FIG. 3 . In some examples, the self-testcontrol logic 212, the self-test control logic 322, and/or the self-testcontrol logic 405 may assert the self-test enable signal to initiateand/or otherwise trigger a self-test of the first comparator logic 214and/or the second comparator logic 216 of FIG. 2 , the comparator logic300 of FIG. 3 , and/or the first comparator logic 402 and/or the secondcomparator logic 404 of FIGS. 4A-4B.

The third waveform 506 implements operation of first comparator logic,such as the first comparator logic 214 of FIG. 2 , the comparator logic300 of FIG. 3 , and/or the first comparator logic 402 of FIGS. 4A-4B.The fourth waveform 508 implements operation of second comparator logic,such as the second comparator logic 216 of FIG. 2 , the comparator logic300 of FIG. 3 , and/or the second comparator logic 404 of FIGS. 4A-4B.

The fifth waveform 510 implements a first test mode match signal(TM1_MATCH_TEST). In some examples, the fifth waveform 510 may implementthe MATCH _TEST signal of FIG. 3 and/or the TM1_MATCH_TEST signal ofFIGS. 4A-4B. The sixth waveform 512 implements a first test modemismatch signal (TM1_MISMATCH TEST). In some examples, the sixthwaveform 512 may implement the MISMATCH TEST signal of FIG. 3 and/or theTM1_MISMATCH_TEST signal of FIGS. 4A-4B.

The seventh waveform 514 implements a second test mode match signal(TM2_MATCH_TEST). In some examples, the seventh waveform 514 mayimplement the MATCH_TEST signal of FIG. 3 and/or the TM2_MATCH_TESTsignal of FIGS. 4A-4B. The eighth waveform 516 implements a second testmode mismatch signal (TM2_MISMATCH_TEST). In some examples, the seventhwaveform 516 may implement the MISMATCH_TEST signal of FIG. 3 and/or theTM2_MISMATCH_TEST signal of FIGS. 4A-4B.

In the timing diagram 500 of FIG. 5 , at a first example time (T1) 518,the self-test control logic 212 may assert the second waveform 504 anddeassert the second waveform 504 at a second example time (T2) 520. Inresponse to the deassertion, the self-test control logic 212 asserts thefifth waveform 510 to trigger a match test of the first comparator logicto implement test mode 1. For example, the self-test control logic 212may assert TM1_MATCH_TEST of FIGS. 4A-4B to effectuate a match test ofthe first comparator logic 402 from the second time 520 until a thirdexample time (T3) 522 as described above in connection with FIGS. 2, 3,and/or 4A-4B. Advantageously, the first comparator logic 402 may performa match test of the first comparator logic 402 in two clock cycles ofthe first waveform 502.

At the third time 522, the self-test control logic 212 deasserts thefifth waveform 510 and asserts the sixth waveform 512 to trigger amismatch test of the first comparator logic. For example, the self-testcontrol logic 212 may assert TM1_MISMATCH_TEST of FIGS. 4A-4B toeffectuate a mismatch test of the first comparator logic 402 from thethird time 522 until a fourth example time (T4) 524 as described abovein connection with FIGS. 2, 3, and/or 4A-4Bto implement test mode 1.Advantageously, the first comparator logic 402 may perform a mismatchtest of the first comparator logic 402 in two clock cycles of the firstwaveform 502. Advantageously, the first comparator logic 402 may performa self-test (e.g., a match test and a mismatch test) of the firstcomparator logic 402 in four clock cycles of the first waveform 502.

At the fourth time 524, the self-test control logic 212 deasserts thesixth waveform 512 and asserts the seventh waveform 514 to trigger amatch test of the second comparator logic to implement test mode 2. Inresponse to the deassertion of the sixth waveform 512, the self-test ofthe first comparator logic 402 is complete and may return to functionaloperation with compare functions enabled. At the fourth time 524, theself-test control logic 212 may assert TM2_MATCH _TEST of FIGS. 4A-4B toeffectuate a match test of the second comparator logic 404 from thefourth time 524 until a fifth example time (T5) 526 as described abovein connection with FIGS. 2, 3, and/or 4A-4B. Advantageously, the secondcomparator logic 404 may perform a match test of the second comparatorlogic 404 in two clock cycles of the first waveform 502.

At the fifth time 526, the self-test control logic 212 deasserts theseventh waveform 514 and asserts the eighth waveform 516 to trigger amismatch test of the second comparator logic to implement test mode 2.For example, the self-test control logic 212 may assertTM2_MISMATCH_TEST of FIGS. 4A-4B to effectuate a mismatch test of thesecond comparator logic 404 from the fifth time 526 until a sixthexample time (T6) 528 as described above in connection with FIGS. 2, 3,and/or 4A-4B. In response to the deassertion of the eighth waveform 516,the self-test of the second comparator logic 404 is complete and mayreturn to functional operation with compare functions enabled.

Advantageously, the second comparator logic 404 may perform a mismatchtest of the second comparator logic 404 in two clock cycles of the firstwaveform 502. Advantageously, the second comparator logic 404 mayperform a self-test (e.g., a match test and a mismatch test) of thesecond comparator logic 404 in four clock cycles of the first waveform502. Advantageously, the dual comparator logic 400 of FIGS. 4A-4B mayperform an entire self-test (e.g., a match and mismatch test for thefirst comparator logic 402 and a match and mismatch test for the secondcomparator logic 404) in eight clock cycles of the first waveform 502.

Flowcharts representative of example processes, hardware logic, machinereadable instructions, hardware implemented state machines, and/or anycombination thereof for implementing the example LCL 104 of FIG. 1 , theexample lockstep wrapper 200 of FIG. 2 or portion(s) thereof, theexample comparator logic 300 of FIG. 3 , and/or the example dualcomparator logic 400 of FIGS. 4A-4B are shown in FIGS. 6-7 . Theprocesses and/or machine readable instructions may be one or moreexecutable programs or portion(s) of an executable program for executionby a computer processor and/or processor circuitry, such as theprocessor 812 shown in the example processor platform 800 discussedbelow in connection with FIG. 8 . The program may be embodied insoftware stored on a non-transitory computer readable storage mediumsuch as a CD-ROM, a floppy disk, a hard drive, a DVD, a Blu-ray disk, ora memory associated with the processor 812, but the entire programand/or parts thereof could alternatively be executed by a device otherthan the processor 812 and/or embodied in firmware or dedicatedhardware. Further, although the example program is described withreference to the flowcharts illustrated in FIGS. 6-7 , many othermethods of implementing the example LCL 104 of FIG. 1 , the examplelockstep wrapper 200 of FIG. 2 or portion(s) thereof, the examplecomparator logic 300 of FIG. 3 , and/or the example dual comparatorlogic 400 of FIGS. 4A-4B may alternatively be used. For example, theorder of execution of the blocks may be changed, and/or some of theblocks described may be changed, eliminated, or combined. Additionallyor alternatively, any or all of the blocks may be implemented by one ormore hardware circuits (e.g., discrete and/or integrated analog and/ordigital circuitry, an FPGA, an ASIC, a comparator, anoperational-amplifier (op-amp), a logic circuit, etc.) structured toperform the corresponding operation without executing software orfirmware. The processor circuitry may be distributed in differentnetwork locations and/or local to one or more devices (e.g., amulti-core processor in a single machine, multiple processorsdistributed across a server rack, etc.).

The machine readable instructions described herein may be stored in oneor more of a compressed format, an encrypted format, a fragmentedformat, a compiled format, an executable format, a packaged format, etc.Machine readable instructions as described herein may be stored as dataor a data structure (e.g., portions of instructions, code,representations of code, etc.) that may be utilized to create,manufacture, and/or produce machine executable instructions. Forexample, the machine readable instructions may be fragmented and storedon one or more storage devices and/or computing devices (e.g., servers)located at the same or different locations of a network or collection ofnetworks (e.g., in the cloud, in edge devices, etc.). The machinereadable instructions may require one or more of installation,modification, adaptation, updating, combining, supplementing,configuring, decryption, decompression, unpacking, distribution,reassignment, compilation, etc. in order to make them directly readable,interpretable, and/or executable by a computing device and/or othermachine. For example, the machine readable instructions may be stored inmultiple parts, which are individually compressed, encrypted, and storedon separate computing devices, wherein the parts when decrypted,decompressed, and combined form a set of executable instructions thatimplement one or more functions that may together form a program such asthat described herein.

In another example, the machine readable instructions may be stored in astate in which they may be read by processor circuitry, but requireaddition of a library (e.g., a dynamic link library (DLL)), a softwaredevelopment kit (SDK), an application programming interface (API), etc.in order to execute the instructions on a particular computing device orother device. In another example, the machine readable instructions mayneed to be configured (e.g., settings stored, data input, networkaddresses recorded, etc.) before the machine readable instructionsand/or the corresponding program(s) can be executed in whole or in part.Thus, machine readable media, as used herein, may include machinereadable instructions and/or program(s) regardless of the particularformat or state of the machine readable instructions and/or program(s)when stored or otherwise at rest or in transit.

The machine readable instructions described herein can be represented byany past, present, or future instruction language, scripting language,programming language, etc. For example, the machine readableinstructions may be represented using any of the following languages: C,C++, Java, C#, Perl, Python, JavaScript, HyperText Markup Language(HTML), Structured Query Language (SQL), Swift, etc.

As mentioned above, the example processes of FIGS. 6-7 may beimplemented using executable instructions (e.g., computer and/or machinereadable instructions) stored on a non-transitory computer and/ormachine readable medium such as a hard disk drive, a flash memory, aread-only memory, a compact disk, a digital versatile disk, a cache, arandom-access memory and/or any other storage device or storage disk inwhich information is stored for any duration (e.g., for extended timeperiods, permanently, for brief instances, for temporarily buffering,and/or for caching of the information). As used herein, the termnon-transitory computer readable medium is expressly defined to includeany type of computer readable storage device and/or storage disk and toexclude propagating signals and to exclude transmission media.

“Including” and “comprising” (and all forms and tenses thereof) are usedherein to be open ended terms. Thus, whenever a claim employs any formof “include” or “comprise” (e.g., comprises, includes, comprising,including, having, etc.) as a preamble or within a claim recitation ofany kind, it is to be understood that additional elements, terms, etc.may be present without falling outside the scope of the correspondingclaim or recitation. As used herein, when the phrase “at least” is usedas the transition term in, for example, a preamble of a claim, it isopen-ended in the same manner as the term “comprising” and “including”are open ended. The term “and/or” when used, for example, in a form suchas A, B, and/or C refers to any combination or subset of A, B, C such as(1) A alone, (2) B alone, (3) C alone, (4) A with B, (5) A with C, (6) Bwith C, and (7) A with B and with C. As used herein in the context ofdescribing structures, components, items, objects and/or things, thephrase “at least one of A and B” is intended to refer to implementationsincluding any of (1) at least one A, (2) at least one B, and (3) atleast one A and at least one B. Similarly, as used herein in the contextof describing structures, components, items, objects and/or things, thephrase “at least one of A or B” is intended to refer to implementationsincluding any of (1) at least one A, (2) at least one B, and (3) atleast one A and at least one B. As used herein in the context ofdescribing the performance or execution of processes, instructions,actions, activities and/or steps, the phrase “at least one of A and B”is intended to refer to implementations including any of (1) at leastone A, (2) at least one B, and (3) at least one A and at least one B.Similarly, as used herein in the context of describing the performanceor execution of processes, instructions, actions, activities and/orsteps, the phrase “at least one of A or B” is intended to refer toimplementations including any of (1) at least one A, (2) at least one B,and (3) at least one A and at least one B.

As used herein, singular references (e.g., “a”, “an”, “first”, “second”,etc.) do not exclude a plurality. The term “a” or “an” entity, as usedherein, refers to one or more of that entity. The terms “a” (or “an”),“one or more”, and “at least one” can be used interchangeably herein.Furthermore, although individually listed, a plurality of means,elements or method actions may be implemented by, e.g., a single unit orprocessor. Additionally, although individual features may be included indifferent examples or claims, these may possibly be combined, and theinclusion in different examples or claims does not imply that acombination of features is not feasible and/or advantageous.

FIG. 6 is a flowchart representative of an example process 600 that maybe performed using machine readable instructions that may be executedand/or hardware configured to implement the LCL 104 of FIG. 1 , thelockstep wrapper 200 of FIG. 2 or portion(s) thereof, the comparatorlogic 300 of FIG. 3 , and/or the dual comparator logic 400 of FIGS.4A-4B to detect errors associated with at least one comparator.

The process 600 begins at block 602, at which the comparator logic 300of FIG. 3 determines whether a self-test is enabled. For example, theselection logic 304 may determine that a self-test is enabled inresponse to a signal from the self-test control logic 322 indicativethat a self-test is to be executed.

If, at block 602, the comparator logic 300 determines that a self-testhas not been enabled, control proceeds to block 604 to comparefunctional outputs from hardware. For example, the first logic gates332, 334 of FIG. 3 may compare outputs from the primary module 202 andthe secondary module 204 of FIG. 2 .

At block 606, the comparator logic 300 determines whether the functionaloutputs are different. For example, the fifth logic gate 344 may asserta logic high as FUNC_COMPARE_ERROR of FIG. 3 in response to inputs fromthe first bus 314 and the second bus 316 being different. In someexamples, the fifth logic gate 344 may output a logic low asFUNC_COMPARE_ERROR in response to inputs from the first bus 314 and thesecond bus 316 being the same.

If, at block 606, the comparator logic 300 determines that thefunctional outputs are not different, control returns to block 602 todetermine whether the self-test is enabled. If, at block 606, thecomparator logic 300 determines that the functional outputs aredifferent, then, at block 608, the comparator logic 300 outputs afunctional compare error. For example, an indication of a faultcondition in response to FUNC _COMPARE _ERROR being asserted to a logichigh may be stored in the memory 218 of FIG. 2 . In some examples, aresource of the computing system 102 of FIG. 2 may generate an alertindicative of the fault condition. For example, the user interface 124may display the alert, the interface resource 114 may transmit the alertto the central facility 128 via the network 126 of FIG. 1 , etc., and/ora combination thereof. In response to outputting the functional compareerror at block 608, the process 600 of FIG. 6 concludes.

If, at block 602, the comparator logic 300 determines that a self-testis enabled, control proceeds to block 610 to determine whether a matchtest is enabled. For example, the selection logic 304 and/or the errordetection logic 312 may determine that a match test is enabled inresponse to a selection signal and/or an assertion of MATCH_TEST of FIG.3 from the self-test control logic 322.

If, at block 610, the comparator logic 300 determines that a match testis not enabled, control proceeds to block 618 to determine whether amismatch test is enabled. If, at block 610, the comparator logic 300determines that a match test is enabled, then, at block 612, thecomparator logic 300 compares outputs from self-test logic. For example,the self-test control logic 322 may output logic zeros to themultiplexers 324, 326, 328, 330 during a first cycle, a first timeperiod, etc. In such examples, the first logic gates 332, 334 maycompare the outputs from the multiplexers 324, 326, 328, 330 todetermine whether a match is detected. In some such examples, theself-test control logic 322 may output logic ones to the multiplexers324, 326, 328, 330 during a second cycle (after the first cycle), asecond time period (after the first time period), etc. In such examples,the first logic gates 332, 334 may compare the outputs from themultiplexers 324, 326, 328, 330 to determine whether a match isdetected.

At block 614, the comparator logic 300 determines whether a match isdetected based on the comparison of the outputs. For example, the thirdlogic gate 336 may determine whether at least one logic one has beenoutputted from one(s) of the first logic gates 332, 334 during the firstcycle. In such examples, the sixth logic gate 346 may output a logichigh to the eighth logic gate 350 in response to the third logic gate336 determining that at least one logic one has been outputted from theone(s) of the first logic gates 332, 334. In some such examples, thethird logic gate 336 may determine whether at least one logic zero hasbeen outputted from one(s) of the first logic gates 332, 334 during thesecond cycle. In such examples, the sixth logic gate 346 may output alogic high to the eighth logic gate 350 in response to the third logicgate 336 determining that at least one logic zero has been outputtedfrom the one(s) of the first logic gates 332, 334.

If, at block 614, the comparator logic 300 determines that a match isdetected based on the comparison of the outputs, control proceeds toblock 618 to determine whether a mismatch test is enabled. If, at block614, the comparator logic 300 determines that a match is not detectedbased on the comparison of the outputs, then, at block 616, thecomparator logic 300 outputs a self-test error. For example, the eighthlogic gate 350 may assert a logic high as the SELF-TEST_ERROR output ofFIG. 3 . In some examples, a fault indication of a self-test error, aprogram counter value associated with the self-test error, etc., may bestored in the memory 218 as the lockstep debug data 220. In someexamples, a resource of the computing system 102 of FIG. 2 may generatean alert indicative of the self-test error. For example, the userinterface 124 may display the alert, the interface resource 114 maytransmit the alert to the central facility 128 via the network 126 ofFIG. 1 , etc., and/or a combination thereof.

In response to outputting the self-test error at block 616, thecomparator logic 300 determines whether a mismatch test is enabled atblock 618. For example, the selection logic 304 and/or the errordetection logic 312 may determine that a mismatch test is enabled inresponse to a selection signal and/or an assertion of MISMATCH_TEST ofFIG. 3 from the self-test control logic 322.

If, at block 618, the comparator logic 300 determines that a mismatchtest is not enabled, control proceeds to block 626 to determine whetherto continue monitoring the hardware. If, at block 618, the comparatorlogic 300 determines that a mismatch test is enabled, then, at block620, the comparator logic 300 compares outputs from the self-test logic.For example, the self-test control logic 322 may output logic ones tothe first portion of the multiplexers 324, 326, 328, 330 and outputlogic zeros to the second portion of the multiplexers 324, 326, 328, 330during a first cycle. In such examples, the first logic gates 332, 334may compare the outputs from the multiplexers 324, 326, 328, 330 todetermine whether a mismatch is detected. In some such examples, theself-test control logic 322 may output logic zeros to the first portionof the multiplexers 324, 326, 328, 330 and output logic ones to thesecond portion of the multiplexers 324, 326, 328, 330 during a secondcycle after the first cycle. In such examples, the first logic gates332, 334 may compare the outputs from the multiplexers 324, 326, 328,330 to determine whether a mismatch is detected.

At block 622, the comparator logic 300 determines whether a mismatch isdetected based on the comparison of the outputs. For example, the fourthlogic gate 338 may determine whether at least one logic zero has beenoutputted from one(s) of the first logic gates 332, 334 during the firstcycle, the second cycle, etc. In such examples, the seventh logic gate348 may output a logic high to the eighth logic gate 350 in response tothe fourth logic gate 338 determining that at least one logic zero hasbeen outputted from the one(s) of the first logic gates 332, 334 duringthe first cycle, the second cycle, etc.

If, at block 622, the comparator logic 300 determines that a mismatchhas not been detected based on the comparison of the outputs, controlproceeds to block 626 to determine whether to continue monitoring thehardware. If, at block 622, the comparator logic 300 determines that amismatch is detected based on the comparison of the outputs, then, atblock 624, the comparator logic 300 outputs a self-test error. Forexample, the eighth logic gate 350 may assert a logic high as theSELF-TEST_ERROR output of FIG. 3 . In some examples, a fault indicationof a self-test error, a program counter value associated with theself-test error, etc., may be stored in the memory 218 as the lockstepdebug data 220. In some examples, a resource of the computing system 102of FIG. 2 may generate an alert indicative of the self-test error. Forexample, the user interface 124 may display the alert, the interfaceresource 114 may transmit the alert to the central facility 128 via thenetwork 126 of FIG. 1 , etc., and/or a combination thereof.

In response to the comparator logic 300 outputting the self-test errorat block 624, the comparator logic 300 determines whether to continuemonitoring the hardware at block 626. If, at block 626, the comparatorlogic 300 determines to continue monitoring the hardware, controlreturns to block 602 to determine whether a self-test is enabled,otherwise the process 600 of FIG. 6 concludes.

FIG. 7 is another flowchart representative of an example process 700that may be performed using machine readable instructions that may beexecuted and/or hardware configured to implement the LCL 104 of FIG. 1 ,the lockstep wrapper 200 of FIG. 2 or portion(s) thereof, and/or thedual comparator logic 400 of FIGS. 4A-4B to detect errors associatedwith at least two comparators.

The process 700 begins at block 702, at which the dual comparator logic400 of FIGS. 4A-4B identifies the comparator under self-test. Forexample, the first selection logic 408 may identify that the firstcomparator logic 402 is under self-test in response to a signal from theself-test control logic 405 of FIGS. 4A-4B, which may indicate that thefirst comparator logic 402 is to perform a self-test (e.g., a matchtest, a mismatch test, etc.).

At block 704, the dual comparator logic 400 compares functional outputsfrom hardware using comparator not executing self-test. For example, thesecond logic gates 470 may compare outputs from the primary module 202and the secondary module 204 of FIG. 2 .

At block 706, the dual comparator logic 400 determines whether thefunctional outputs are different. For example, the fifth logic gate 478may assert a logic high as FUNC_COMPARE_ERROR2 of FIGS. 4A-4B inresponse to inputs from the first bus 489 and the second bus 490 beingdifferent. In some examples, the fifth logic gate 478 may output a logiclow as FUNC _COMPARE _ERROR2 in response to inputs from the first bus489 and the second bus 490 being the same.

If, at block 706, the dual comparator logic 400 determines that thefunctional outputs are not different, control proceeds to block 710 todetermine whether a match test is enabled. If, at block 706, the dualcomparator logic 400 determines that the functional outputs aredifferent, then, at block 708, the dual comparator logic 400 outputs afunctional compare error from the comparator not executing a self-test.For example, an indication of a fault condition in response toFUNC_COMPARE_ERROR2 being asserted to a logic high may be stored in thememory 218 of FIG. 2 . In some examples, a resource of the computingsystem 102 of FIG. 2 may generate an alert indicative of the faultcondition. For example, the user interface 124 may display the alert,the interface resource 114 may transmit the alert to the centralfacility 128 via the network 126 of FIG. 1 , etc., and/or a combinationthereof.

In response to outputting the functional compare error at block 708,control proceeds to block 710 to determine whether a match test isenabled. For example, the first selection logic 408 and/or the firsterror detection logic 418 may determine that a match test is enabled inresponse to a selection signal and/or an assertion of TM1_MATCH_TEST ofFIGS. 4A-4B from the self-test control logic 405.

If, at block 710, the dual comparator logic 400 determines that a matchtest is not enabled, control proceeds to block 718 to determine whethera mismatch test is enabled. If, at block 710, the dual comparator logic400 determines that a match test is enabled, then, at block 712, thedual comparator logic 400 compares outputs from self-test logic. Forexample, the self-test logic 405 may output logic zeros to the first setof multiplexers 420, 422 and the third set of multiplexers 462, 464during a first cycle, a first time period, etc. In such examples, thefirst logic gates 428, 430 may compare the outputs from the first set ofmultiplexers 420, 422 and the third set of multiplexers 462, 464 todetermine whether a match is detected. In some such examples, theself-test logic 405 may output logic ones to the first set ofmultiplexers 420, 422 and the third set of multiplexers 462, 464 duringa second cycle after the first cycle, a second time period after thefirst time period, etc. In such examples, the first logic gates 428, 430may compare the outputs from the first set of multiplexers 420, 422 andthe third set of multiplexers 462, 464 to determine whether a match isdetected.

At block 714, the dual comparator logic 400 determines whether a matchis detected based on the comparison of the outputs. For example, thethird logic gate 432 may determine whether at least one logic one hasbeen outputted from one(s) of the first logic gates 428, 430, which mayindicate that a match has not been detected. In such examples, the sixthlogic gate 438 may output a logic high to the tenth logic gate 446 inresponse to the third logic gate 432 determining that at least one logicone has been outputted from the one(s) of the first logic gates 428,430.

If, at block 714, the dual comparator logic 400 determines that a matchis detected based on the comparison of the outputs, control proceeds toblock 718 to determine whether a mismatch test is enabled. If, at block714, the dual comparator logic 400 determines that a match has not beendetected based on the comparison of the outputs, then, at block 716, thedual comparator logic 400 outputs a self-test error from the comparatorunder self-test. For example, the tenth logic gate 446 may assert alogic high as the SELF-TEST _ERROR1 output of FIG. 3 . In some examples,a fault indication of a self-test error, a program counter valueassociated with the self-test error, etc., may be stored in the memory218 as the lockstep debug data 220. In some examples, a resource of thecomputing system 102 of FIG. 2 may generate an alert indicative of theself-test error. For example, the user interface 124 may display thealert, the interface resource 114 may transmit the alert to the centralfacility 128 via the network 126 of FIG. 1 , etc., and/or a combinationthereof.

In response to outputting the self-test error from the comparator underself-test at block 716, the dual comparator logic 400 determines whethera mismatch test is enabled at block 718. For example, the firstselection logic 408 and/or the first error detection logic 418 maydetermine that a mismatch test is enabled in response to a selectionsignal and/or an assertion of TM1_MISMATCH _TEST of FIGS. 4A-4B from theself-test control logic 405.

If, at block 718, the dual comparator logic 400 determines that amismatch test is not enabled, control proceeds to block 726 to determinewhether to continue monitoring the hardware. If, at block 718, the dualcomparator logic 400 determines that a mismatch test is enabled, then,at block 720, the dual comparator logic 400 compares outputs from theself-test logic. For example, the self-test logic 405 may output logicones to the first set of multiplexers 420, 422 and logic zeros to thethird set of multiplexers 462, 464 during a first cycle, a first timeperiod, etc. In such examples, the first logic gates 428, 430 maycompare the outputs from the first set of multiplexers 420, 422 and thethird set of multiplexers 462, 464 to determine whether a mismatch isdetected. In some such examples, the self-test logic 405 may outputlogic zeros to the first set of multiplexers 420, 422 and logic ones tothe third set of multiplexers 462, 464 during a second cycle after thefirst cycle, a second time period after the first time period, etc. Insuch examples, the first logic gates 428, 430 may compare the outputsfrom the first set of multiplexers 420, 422 and the third set ofmultiplexers 462, 464 to determine whether a mismatch is detected.

At block 722, the dual comparator logic 400 determines whether amismatch is detected based on the comparison of the outputs. Forexample, the fourth logic gate 434 may determine whether at least onelogic zero has been outputted from one(s) of the first logic gates 428,430, which may indicate that a mismatch is detected. In such examples,the seventh logic gate 440 may output a logic high to the tenth logicgate 446 in response to the fourth logic gate 434 determining that atleast one logic zero has been outputted from the one(s) of the firstlogic gates 428, 430.

If, at block 722, the dual comparator logic 400 determines that amismatch is not detected based on the comparison of the outputs, controlproceeds to block 726 to determine whether to continue monitoring thehardware. If, at block 722, the dual comparator logic 400 determinesthat a mismatch is detected based on the comparison of the outputs,then, at block 724, the dual comparator logic 400 outputs a self-testerror from the comparator under self-test. For example, the tenth logicgate 446 may assert a logic high as the SELF-TEST_ERROR1 output of FIGS.4A-4B. In some examples, a fault indication of a self-test error, aprogram counter value associated with the self-test error, etc., may bestored in the memory 218 as the lockstep debug data 220. In someexamples, a resource of the computing system 102 of FIG. 2 may generatean alert indicative of the self-test error. For example, the userinterface 124 may display the alert, the interface resource 114 maytransmit the alert to the central facility 128 via the network 126 ofFIG. 1 , etc., and/or a combination thereof.

In response to outputting the self-test error from the comparator underself-test at block 724, the dual comparator logic 400 determines whetherto continue monitoring the hardware. If, at block 726, the dualcomparator logic 400 determines to continue monitoring the hardware,control returns to block 702 to select a comparator to self-test,otherwise the process 700 of FIG. 7 concludes.

FIG. 8 is a block diagram of an example processor platform 800structured to execute the instructions of FIGS. 6-7 to implement the LCL104 of FIG. 1 , the lockstep wrapper 200 of FIG. 2 or portion(s)thereof, the comparator logic 300 of FIG. 3 , and/or the dual comparatorlogic 400 of FIGS. 4A-4B. The processor platform 800 can be, forexample, an electronic control unit of a vehicle, a server, a personalcomputer, a workstation, a self-learning machine (e.g., a neuralnetwork), a gaming console, or any other type of computing device.

The processor platform 800 of the illustrated example includes twoprocessors 812. The two processors 812 of the illustrated example arehardware. For example, the processors 812 can be implemented by one ormore integrated circuits, logic circuits, microprocessors, GPUs, DSPs,or controllers from any desired family or manufacturer. The hardwareprocessors may be a semiconductor based (e.g., silicon based) device.

The processors 812 of the illustrated example includes a local memory813 (e.g., a cache). The processors 812 of the illustrated example arein communication with a main memory including a volatile memory 814 anda non-volatile memory 816 via a bus 818. The volatile memory 814 may beimplemented by one or more flip-flops, Synchronous Dynamic Random AccessMemory (SDRAM), Dynamic Random Access Memory (DRAM), RAMBUS® DynamicRandom Access Memory (RDRAM®) and/or any other type of random accessmemory device. The non-volatile memory 816 may be implemented by flashmemory and/or any other desired type of memory device. Access to themain memory 814, 816 is controlled by a memory controller.

The processor platform 800 of the illustrated example also includes aninterface circuit 820. The interface circuit 820 may be implemented byany type of interface standard, such as an Ethernet interface, auniversal serial bus (USB), a Bluetooth® interface, a near fieldcommunication (NFC) interface, and/or a PCI express interface.

In the illustrated example, one or more input devices 822 are connectedto the interface circuit 820. The input device(s) 822 permit(s) a userto enter data and/or commands into the processor 812. The inputdevice(s) can be implemented by, for example, an audio sensor, amicrophone, a camera (still or video), a keyboard, a button, a mouse, atouchscreen, a track-pad, a trackball, an isopoint device, and/or avoice recognition system.

One or more output devices 824 are also connected to the interfacecircuit 820 of the illustrated example. The output devices 824 can beimplemented, for example, by display devices (e.g., a light emittingdiode (LED), an organic light emitting diode (OLED), a liquid crystaldisplay (LCD), a cathode ray tube (CRT) display, an in-place switching(IPS) display, a touchscreen, etc.), a tactile output device, a printerand/or speaker. The interface circuit 820 of the illustrated example,thus, typically includes a graphics driver card, a graphics driver chipand/or a graphics driver processor.

The interface circuit 820 of the illustrated example also includes acommunication device such as a transmitter, a receiver, a transceiver, amodem, a residential gateway, a wireless access point, and/or a networkinterface to facilitate exchange of data with external machines (e.g.,computing devices of any kind) via a network 826. The communication canbe via, for example, an Ethernet connection, a digital subscriber line(DSL) connection, a telephone line connection, a coaxial cable system, asatellite system, a line-of-site wireless system, a cellular telephonesystem, etc.

The processor platform 800 of the illustrated example also includes oneor more mass storage devices 828 for storing software and/or data.Examples of such mass storage devices 828 include floppy disk drives,hard drive disks, compact disk drives, Blu-ray disk drives, redundantarray of independent disks (RAID) systems, and digital versatile disk(DVD) drives.

The machine executable instructions 832 of FIGS. 6-7 may be stored inthe mass storage device 828, in the volatile memory 814, in thenon-volatile memory 816, and/or on a removable non-transitory computerreadable storage medium such as a CD or DVD.

An example LCL 834 is coupled to one(s) of the processors 812, thevolatile memory 814, the non-volatile memory 816, the interface 820,and/or the one or more mass storage devices 828 via the bus 818. In someexamples, the LCL 834 may be implemented by the LCL 104 of FIG. 1 , thelockstep wrapper 200 of FIG. 2 or portion(s) thereof, the comparatorlogic 300 of FIG. 3 , and/or the dual comparator logic 400 of FIGS.4A-4B. For example, the LCL 834 may test the lockstep of the processors812. In some examples, the LCL 834 may self-test one or more comparatorsincluded in and/or otherwise implemented by the LCL 834 as describedherein.

From the foregoing, it will be appreciated that example methods,apparatus, and articles of manufacture have been described thatimplement lockstep comparators. Advantageously, the example methods,apparatus, and articles of manufacture described herein may implementdual comparators with online test sequencing. For example, the examplemethods, apparatus, and articles of manufacture described herein mayimplement smart redundancy of a comparator utilized to test the lockstepof two or more hardware resources. Advantageously, the example methods,apparatus, and articles of manufacture described herein may implementdiagnostics to minimize and/or otherwise reduce a self-test time of alockstep comparator to eight cycles independent of the number of signalsbeing compared.

Advantageously, the example methods, apparatus, and articles ofmanufacture described herein may freeze a compare state of the one ormore lockstep comparators in response to a detection of miscompare andmay make the compare state (among other debug data such as an associatedprogram counter value) readable and/or otherwise available to anapplication and/or other hardware resource. Advantageously, the examplemethods, apparatus, and articles of manufacture described herein mayeffectuate lockstep to always be enabled even during self-test executionof the one or more lockstep comparators. For example, the examplemethods, apparatus, and articles of manufacture described herein mayperform the self-test of lockstep during application execution withoutcompromising application integrity.

Example methods, apparatus, systems, and articles of manufacture toimplement lockstep comparators are described herein. Further examplesand combinations thereof include the following:

Example 1 includes an apparatus comprising self-test logic circuitryhaving first outputs, and comparator logic including selection logichaving first inputs and second outputs, ones of the first inputs coupledto the first outputs, first detection logic having second inputs andthird outputs, the second inputs coupled to the second outputs, seconddetection logic having third inputs and fourth outputs, the third inputscoupled to the third outputs, latch logic having fifth inputs and fifthoutputs, the third output and the fourth output coupled to the fifthinputs, and error detection logic having sixth inputs coupled to thefifth inputs.

Example 2 includes the apparatus of example 1, wherein the selectionlogic includes a plurality of multiplexers, ones of the plurality of themultiplexers having a respective one of the first inputs and arespective one of the second outputs.

Example 3 includes the apparatus of example 2, further including a firstlatch having a seventh input and a sixth output, the seventh input to becoupled to one or more seventh outputs of a first processor, and asecond latch having an eighth input and an eighth output, the eightinput to be coupled to one or more ninth outputs of a second processor,the first processor to be configured to operate in lockstep with thesecond processor.

Example 4 includes the apparatus of example 3, wherein the sixth outputis coupled to respective ones of the first inputs of a first set of theplurality of the multiplexers and the eighth output is coupled torespective ones of the second inputs of a second set of the plurality ofthe multiplexers, the first set different from the second set.

Example 5 includes the apparatus of example 1, wherein the firstdetection logic includes a plurality of logic gates having the secondinputs and the third outputs.

Example 6 includes the apparatus of example 5, wherein ones of theplurality of the logic gates are exclusive or logic gates.

Example 7 includes the apparatus of example 1, wherein the latch logicincludes a first latch having a seventh input and a sixth output, theseventh input coupled to the second detection logic, the sixth outputcoupled to the error detection logic, and a second latch having aneighth input and a seventh output, the eighth input coupled to thesecond detection logic, the seventh output coupled to the errordetection logic.

Example 8 includes the apparatus of example 7, wherein the seconddetection logic includes a first logic gate and a second logic gate, thefirst logic gate and the second logic gate having ones of the thirdinputs and the fourth outputs, the seventh input coupled to the firstlogic gate through a first one of the fourth outputs, the eighth inputcoupled to the second logic gate through a second one of the fourthoutputs.

Example 9 includes the apparatus of example 8, wherein the first logicgate is an OR logic gate and the second logic gate is a NAND logic gate.

Example 10 includes the apparatus of example 7, wherein the errordetection logic includes a first logic gate having a ninth input, theninth input coupled to the sixth output, a second logic gate having atenth input and a ninth output, the tenth input coupled to the sixthoutput, a third logic gate having an eleventh input and a tenth output,the eleventh input coupled to the seventh output, and a fourth logicgate having a twelfth input and a thirteenth input, the twelfth inputcoupled to the ninth output, the thirteenth input coupled to the tenthoutput.

Example 11 includes the apparatus of example 10, wherein the first logicgate, the second logic gate, and the third logic gate are AND logicgates, and the fourth logic gate is an OR logic gate.

Example 12 includes the apparatus of example 1, wherein the latch logicis first latch logic, further including second latch logic, theselection logic coupled to a first processor and a second processorthrough the second latch logic, and the self-test logic circuitry is toin response to a first control signal, instruct the error detectionlogic to test whether a first processor output from the first processormatches a second processor output from the second processor, and inresponse to a second control signal, instruct the error detection logicto self-test the first detection logic.

Example 13 includes the apparatus of example 12, wherein the self-testincludes a first self-test and a second self-test, and the self-testlogic circuitry is to invoke the first self-test to execute in two clockcycles, and invoke the second self-test to execute in two clock cycles,the first detection logic to execute the self-test in four clock cyclesbased on the first self-test and the second self-test.

Example 14 includes the apparatus of example 12, wherein the errordetection logic is to identify a first fault condition in response todetermining that the first processor output does not match the secondprocessor output, identify a second fault condition in response to afailure of the self-test, and in response to an identification of atleast one of the first fault condition or the second fault condition,transmit lockstep debug data to a user interface, the lockstep debugdata including at least one of port information or program counterinformation associated with at least one of the first fault condition orthe second fault condition.

Example 15 includes an apparatus comprising first comparator logicconfigured to receive a first input from a first processor and a secondinput from a second processor, second comparator logic coupled to thefirst comparator logic, the second comparator logic configured toreceive the first input and the second input, and self-test logiccircuitry coupled to the first comparator logic and the secondcomparator logic, the self-test logic circuitry to, in response to oneor more first control signals instruct the first comparator logic tocompare the first input and the second input, and instruct the secondcomparator logic to perform a self-test of the second comparator logic.

Example 16 includes the apparatus of example 15, wherein the self-testlogic circuitry is to, in response to generating one or more secondcontrol signals instruct the first comparator logic to perform aself-test of the first comparator logic, and instruct the secondcomparator logic to compare a third input of the first processor and afourth input of the second processor, the first processor to beconfigured to operate in lockstep with the second processor.

Example 17 includes the apparatus of example 15, wherein the firstcomparator logic includes selection logic, first detection logic coupledto the selection logic, second detection logic coupled to the firstdetection logic, a first latch coupled to the second detection logic, asecond latch coupled to the second detection logic, and error detectionlogic coupled to the first latch and the second latch.

Example 18 includes the apparatus of example 17, wherein the selectionlogic is first selection logic, and the second comparator logic includessecond selection logic, the second selection logic coupled to the firstdetection logic.

Example 19 includes the apparatus of example 17, wherein the first latchhas a first input and a first output, the second latch has a secondinput and a second output, and the error detection logic includes afirst logic gate having a third input and a third output, the thirdinput coupled to the first output, a second logic gate having a fourthinput and a fourth output, the fourth input coupled to the first output,a third logic gate having a fifth input and a fifth output, the fifthinput coupled to the second output, and a fourth logic gate having asixth input, a seventh input, and a sixth output, the sixth inputcoupled to the fourth output, the seventh input coupled to the fifthoutput.

Example 20 includes the apparatus of example 19, wherein at least one ofthe third output or the sixth output are coupled to memory.

Example 21 includes a system comprising first processor hardware havingfirst outputs, second processor hardware having second outputs, andlockstep control logic including first comparator logic having thirdinputs and fourth inputs, the third inputs coupled to the first outputs,second comparator logic having fifth inputs and sixth inputs, the fifthinputs coupled to the second outputs, and self-test control logic havingthird outputs and fourth outputs, the third outputs coupled to thefourth inputs, the fourth outputs coupled to the sixth inputs.

Example 22 includes the system of example 21, wherein the self-testcontrol logic is to execute a first self-test of the first comparatorlogic in two clock cycles, execute a second self-test of the firstcomparator logic in two clock cycles, execute the first self-test of thesecond comparator logic in two clock cycles, and execute the secondself-test of the second comparator logic in two clock cycles.

Example 23 includes the system of example 21, wherein the self-testcontrol logic is to generate one or more control signals to instruct thefirst comparator logic to compare the first outputs and the secondoutputs, and instruct the second comparator logic to perform a self-testof the second comparator logic.

Example 24 includes the system of example 23, wherein the one or morecontrol signals are one or more first control signals, and the self-testcontrol logic is to generate one or more second control signals toinstruct the first comparator logic to perform a self-test of the firstcomparator logic, and instruct the second comparator logic to comparefifth outputs of the first processor hardware and sixth outputs of thesecond processor hardware, the first processor hardware to be configuredto operate in lockstep with the second processor hardware.

Example 25 includes the system of example 23, wherein the firstcomparator logic is to identify a first fault condition in response todetermining that one or more of the first outputs do not match one ormore of the second outputs, and in response to an identification of thefirst fault condition, transmit first lockstep debug data to a userinterface, the first lockstep debug data including at least one of firstport information or first program counter information associated withthe first fault condition, and the second comparator logic is toidentify a second fault condition in response to a failure of theself-test, and in response to an identification of the second faultcondition, transmit second lockstep debug data to the user interface,the second lockstep debug data including at least one of second portinformation or second program counter information associated with thesecond fault condition.

Although certain example methods, apparatus and articles of manufacturehave been disclosed herein, the scope of coverage of this patent is notlimited thereto. On the contrary, this patent covers all methods,apparatus and articles of manufacture fairly falling within the scope ofthe claims of this patent.

The following claims are hereby incorporated into this DetailedDescription by this reference, with each claim standing on its own as aseparate embodiment of the present disclosure.

What is claimed is:
 1. An apparatus comprising: self-test logiccircuitry; and comparator logic including: selection logic coupled tothe self-test logic circuitry; first detection logic coupled to anoutput of the selection logic; second detection logic coupled to anoutput of the first detection logic; latch logic coupled to an output ofthe second detection logic; and error detection logic coupled to outputsof the latch logic.
 2. The apparatus of claim 1, wherein the selectionlogic includes a plurality of multiplexers, wherein at least one inputof each of the multiplexers is coupled to the self-test logic circuitry.3. The apparatus of claim 2, further including: a first latch coupled toan output of a first processor; and a second latch coupled to an outputof a second processor, the first processor to be configured to operatein lockstep with the second processor.
 4. The apparatus of claim 3,wherein the first latch is coupled to a first multiplexer of themultiplexers and the second latch is coupled to a second multiplexer ofthe plurality of the multiplexers.
 5. The apparatus of claim 1, whereinthe first detection logic includes a plurality of logic gates.
 6. Theapparatus of claim 5, wherein one of the plurality of the logic gates isan exclusive or logic gate.
 7. The apparatus of claim 1, wherein thelatch logic includes: a first latch coupled to a first output of thesecond detection logic and to a first input of the error detectionlogic, wherein the output of the second detection logic is the firstoutput of the second detection logic; and a second latch coupled to asecond output of the second detection logic and to a second input of theerror detection logic.
 8. The apparatus of claim 7, wherein the seconddetection logic includes a first logic gate and a second logic gate,each having: a first input coupled to a first output of the firstdetection logic; a second input coupled to a second output of the firstdetection logic; and an output coupled to one of the first output of thesecond detection logic or the second output of the second detectionlogic.
 9. The apparatus of claim 8, wherein the first logic gate is anOR logic gate and the second logic gate is a NAND logic gate.
 10. Theapparatus of claim 7, wherein the error detection logic includes: afirst logic gate coupled to the output of the first latch of the latchlogic ; a second logic gate coupled to the output of the first latch ofthe latch logic and to the first logic gate; a third logic gate coupledto the output of the second latch of the latch logic; and a fourth logicgate coupled to the second logic gate and the third logic gate.
 11. Theapparatus of claim 10, wherein the first logic gate, the second logicgate, and the third logic gate are AND logic gates, and the fourth logicgate is an OR logic gate.
 12. The apparatus of claim 1, wherein thelatch logic is first latch logic, the apparatus further including secondlatch logic, the selection logic coupled to a first processor and asecond processor through the second latch logic, and the self-test logiccircuitry is to: in response to a first control signal, instruct theerror detection logic to test whether a first processor output from thefirst processor matches a second processor output from the secondprocessor; and in response to a second control signal, instruct theerror detection logic to self-test the first detection logic.
 13. Theapparatus of claim 12, wherein the self-test includes a first self-testand a second self-test, and the self-test logic circuitry is configuredto: invoke the first self-test to execute in two clock cycles; andinvoke the second self-test to execute in two clock cycles, the firstdetection logic to execute the self-test in four clock cycles based onthe first self-test and the second self-test.
 14. The apparatus of claim12, wherein the error detection logic is configured to: identify a firstfault condition in response to determining that the first processoroutput does not match the second processor output; identify a secondfault condition in response to a failure of the self-test; and inresponse to an identification of at least one of the first faultcondition or the second fault condition, transmit lockstep debug data toa user interface, the lockstep debug data including at least one of portinformation or program counter information associated with at least oneof the first fault condition or the second fault condition.
 15. Anapparatus comprising: first comparator logic coupled to a firstprocessor and a second processor; second comparator logic coupled to thefirst comparator logic, to the first processor, and to the secondprocessor; and self-test logic circuitry coupled to the first comparatorlogic and the second comparator logic, the self-test logic circuitryconfigured to, in response to one or more first control signals:instruct the first comparator logic to compare an input from the firstprocessor and a second input from the second processor; and instruct thesecond comparator logic to perform a self-test of the second comparatorlogic.
 16. The apparatus of claim 15, wherein the self-test logiccircuitry is to, in response to generating one or more second controlsignals: instruct the first comparator logic to perform a self-test ofthe first comparator logic; and instruct the second comparator logic tocompare a third input of the first processor and a fourth input of thesecond processor, the first processor to be configured to operate inlockstep with the second processor.
 17. The apparatus of claim 15,wherein the first comparator logic includes: selection logic; firstdetection logic coupled to the selection logic; second detection logiccoupled to the first detection logic; a first latch coupled to thesecond detection logic; a second latch coupled to the second detectionlogic; and error detection logic coupled to the first latch and thesecond latch.
 18. The apparatus of claim 17, wherein the selection logicis first selection logic, and the second comparator logic includessecond selection logic, the second selection logic coupled to the firstdetection logic.
 19. The apparatus of claim 17, wherein the first latchhas a first input and a first output, the second latch has a secondinput and a second output, and the error detection logic includes: afirst logic gate coupled to the first latch; a second logic gate coupledto the first latch; a third logic gate coupled to the second latch; anda fourth logic gate coupled to second logic gate and the third logicgate.
 20. The apparatus of claim 19, wherein at least one of the firstlogic gate or the fourth logic gate are coupled to memory.
 21. A systemcomprising: a first processor; a second processor ; and lockstep controllogic including: first comparator logic coupled to the first processor;second comparator logic coupled to the second processor; and self-testcontrol logic coupled to an input of the first comparator logic, theself-test control logic having an output coupled to an input of thesecond comparator logic.
 22. The system of claim 21, wherein theself-test control logic is configured to: execute a first self-test ofthe first comparator logic in two clock cycles; execute a secondself-test of the first comparator logic in two clock cycles; execute thefirst self-test of the second comparator logic in two clock cycles; andexecute the second self-test of the second comparator logic in two clockcycles.
 23. The system of claim 21, wherein the self-test control logicis configured to generate one or more control signals to: instruct thefirst comparator logic to compare outputs of the first processor andoutputs of the second processor; and instruct the second comparatorlogic to perform a self-test of the second comparator logic.
 24. Thesystem of claim 23, wherein the one or more control signals are one ormore first control signals, and the self-test control logic isconfigured to generate one or more second control signals to: instructthe first comparator logic to perform a self-test of the firstcomparator logic; and instruct the second comparator logic to comparefifth outputs of the first processor and sixth outputs of the secondprocessor, the first processor to be configured to operate in lockstepwith the second processor.
 25. The system of claim 23, wherein: thefirst comparator logic is configured to: identify a first faultcondition in response to determining that one or more of the outputs ofthe first processor do not match one or more of the outputs of thesecond processor; and in response to an identification of the firstfault condition, transmit first lockstep debug data to a user interface,the first lockstep debug data including at least one of first portinformation or first program counter information associated with thefirst fault condition; and the second comparator logic is to: identify asecond fault condition in response to a failure of the self-test; and inresponse to an identification of the second fault condition, transmitsecond lockstep debug data to the user interface, the second lockstepdebug data including at least one of second port information or secondprogram counter information associated with the second fault condition.